Beam divergence angle distribution dependence on data pattern

Sulaiman S. Al-Sowayan; Kevin L. Lear

doi:10.1117/12.532272

16 June 2004 Beam divergence angle distribution dependence on data pattern

Proceedings Volume 5364, Vertical-Cavity Surface-Emitting Lasers VIII; (2004) https://doi.org/10.1117/12.532272
Event: Integrated Optoelectronic Devices 2004, 2004, San Jose, CA, United States

Abstract

Data patterns are shown to affect the far field distribution of vertical cavity surface emitting lasers (VCSELs). Two data patterns with different frequency content resulted in different beam profile distributions even though both patterns had 50% duty cycles resulting in the same thermal dissipation. The effect of gain switching and varying high and low drive levels was also investigated. Angle dependent waveforms displayed overshoot on axis and undershoot off axis. The potential impact of pattern dependent launch conditions is discussed.

Citation Download Citation

Sulaiman S. Al-Sowayan and Kevin L. Lear "Beam divergence angle distribution dependence on data pattern", Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); https://doi.org/10.1117/12.532272

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