Paper
16 June 2004 Manufacturing and engineering prospects of VCSEL in TrueLight
Bor-Lin Lee, Horng-Ching Lai, June-Han Wu, Alice C. F. Li, Steven Shih-Yu Huang, Ang Wu, Jin-Shan Pan, Calvin C. C. Wu, Kai-Feng Huang
Author Affiliations +
Abstract
By continuing on the VCSEL studies, TrueLight’s VCSEL was proven to be a highly reliable product for Datacom applications as well as to have cost-effective advantages in manufacturing. In this paper, we will show the fabrication technologies for several Gigabits approach as well as for very low cost sensor applications. We will also show recent achievements in studies of extended operating temperature, single mode emission and long wavelength VCSEL emitted at about 1300 nm.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bor-Lin Lee, Horng-Ching Lai, June-Han Wu, Alice C. F. Li, Steven Shih-Yu Huang, Ang Wu, Jin-Shan Pan, Calvin C. C. Wu, and Kai-Feng Huang "Manufacturing and engineering prospects of VCSEL in TrueLight", Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); https://doi.org/10.1117/12.538666
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Vertical cavity surface emitting lasers

Manufacturing

Oxidation

Semiconducting wafers

Reliability

Process control

Oxides

RELATED CONTENT


Back to Top