Characterization of phase artifacts for focal plane arrays

Jose Manuel Lopez-Alonso; Javier Alda

doi:10.1117/12.543981

5 August 2004 Characterization of phase artifacts for focal plane arrays

Proceedings Volume 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV; (2004) https://doi.org/10.1117/12.543981
Event: Defense and Security, 2004, Orlando, Florida, United States

Abstract

The spatial resolution of Focal Plane Arrays (FPA) is affected by sampling. The artifacts introduced by the sampling procedure are usually referred as "aliasing". Phase artifacts are introduced by the non-isoplanatic nature of the sampling mechanism in FPA. In this paper we introduce a stochastic description of these artifacts. This approach allows us to elucidate similarities and differences between "aliasing" and "phase effects". Figures of merit are introduced in order to characterize regions of isoplanatism in the Fourier Space. The relation between these figures of merit and target perception models is explored in order to clarify further research.

Citation Download Citation

Jose Manuel Lopez-Alonso and Javier Alda "Characterization of phase artifacts for focal plane arrays", Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); https://doi.org/10.1117/12.543981

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