Statistical Properties of the Speckle Phase in Image and Diffraction Fields

N. Takai; H. Kadono; T. Asakura

doi:10.1117/12.949524

25 November 1985 Statistical Properties of the Speckle Phase in Image and Diffraction Fields

N. Takai, H. Kadono, T. Asakura

Proceedings Volume 0556, Intl Conf on Speckle; (1985) https://doi.org/10.1117/12.949524
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

The speckle phases are studied statistically in both image and diffraction fields. The general analysis for these studies is given by introducing an optical "system function" and the results are applied to the analysis of the speckle phases in both fields. The speckle phase distributions are evaluated by a phase angle defined as the extent of the equi-probability density ellipse stretched from the origin in the complex plane of the speckle amplitude.

Citation Download Citation

N. Takai, H. Kadono, and T. Asakura "Statistical Properties of the Speckle Phase in Image and Diffraction Fields", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); https://doi.org/10.1117/12.949524

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