Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique

Masato Higashi; Takeshi Takahashi; Ribun Onodera; Yukihiro Ishii

doi:10.1117/12.580464

20 January 2005 Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique

Masato Higashi, Takeshi Takahashi, Ribun Onodera, Yukihiro Ishii

Proceedings Volume 5633, Advanced Materials and Devices for Sensing and Imaging II; (2005) https://doi.org/10.1117/12.580464
Event: Photonics Asia, 2004, Beijing, China

Abstract

A wavelength-shifting interferometer has been constructed by using a wide-tunable Ti:sapphire laser for three-dimensional range measurement. The phase shifts in five steps by wavelength changes can be measured with an Schwider-Hariharan algorithm in conjunction with sub-fringe measurements by PZT movements in four steps. Experimental results for a step object have been shown.

Citation Download Citation

Masato Higashi, Takeshi Takahashi, Ribun Onodera, and Yukihiro Ishii "Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique", Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); https://doi.org/10.1117/12.580464

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