Low-frequency noise studies in SWIR HgCdTe photodiodes

Yangcheng Huang; Dafu Liu; Yan Zhang; Haimei Gong

doi:10.1117/12.572547

10 January 2005 Low-frequency noise studies in SWIR HgCdTe photodiodes

Yangcheng Huang, Dafu Liu, Yan Zhang, Haimei Gong

Proceedings Volume 5640, Infrared Components and Their Applications; (2005) https://doi.org/10.1117/12.572547
Event: Photonics Asia, 2004, Beijing, China

Abstract

In this paper, low frequency noise has been investigated in SWIR HgCdTe photodiodes from 4Hz to 3.2 KHz at different reverse bias. At low frequency the noise mainly consists of flicker noise and generation recombination (g-r) noise while at high frequency thermal noise is the dominant component. The flicker noise current is proportional to the detector current at small reverse bias, and the Hooge parameter α_H of the device is evaluated. In addition, the low frequency noise at 100mV reverse bias measured from 250-300K are reported. The fluctuation time constant of g-r noise is extracted by fitting the curve of the low frequency noise, and the trap thermal activation energy of the deep level is obtained from the relation of τ and temperature.

Citation Download Citation

Yangcheng Huang, Dafu Liu, Yan Zhang, and Haimei Gong "Low-frequency noise studies in SWIR HgCdTe photodiodes", Proc. SPIE 5640, Infrared Components and Their Applications, (10 January 2005); https://doi.org/10.1117/12.572547

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