Paper
8 December 2004 Study on the test of laser-induced damage threshold of multilayer dielectric gratings
Weijin Kong, Tao Wang, Jianda Shao, Zhengxiu Fan
Author Affiliations +
Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.608040
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
Multi-layer dielectric gratings (MDG) have been more and more used in the chirped-pulse amplification (CPA) system because of its higher diffraction efficiencies and higher damage threshold, which is compared with metallic gratings. Design parameter of multi-layer dielectric and gratings are both given. Laser-induced damage threshold (LIDT) of MDG has been test by employing 1-on-1 methods. The result is 3.24J/cm2 at 1064nm and 12ns pulselength (51.2° incidence). The mechanics of damage is also discussed in several ways.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weijin Kong, Tao Wang, Jianda Shao, and Zhengxiu Fan "Study on the test of laser-induced damage threshold of multilayer dielectric gratings", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.608040
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KEYWORDS
Laser induced damage

Laser damage threshold

Dielectrics

Diffraction gratings

Diffraction

Photomicroscopy

Thin films

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