Si/Ge multilayer structures for optoelectronic applications

George Cirlin; Alexander Tonkikh; Vadim Talalaev; Nikolai Zakharov; Peter Werner

doi:10.1117/12.639339

13 June 2006 Si/Ge multilayer structures for optoelectronic applications

George Cirlin, Alexander Tonkikh, Vadim Talalaev, Nikolai Zakharov, Peter Werner

Proceedings Volume 5946, Optical Materials and Applications; 594610 (2006) https://doi.org/10.1117/12.639339
Event: Optical Materials and Applications, 2005, Tartu, Estonia

Abstract

Quantum-dot Si/Ge superlattice structures with the Ge amount slightly above the critical for island formation are prepared by molecular beam epitaxy. The structures grown under optimized conditions are defect-free. Their structural and optical properties are described. A significant increase in the RT luminescence efficiency is obtained by adjusting such parameters as the growth temperature, growth rate of Ge, the number of the Ge quantum-dot sheets, their thickness, the level of Sb doping at specific planes, and the thickness of Si spacers. An intensive RT electroluminescence from the structures in the fiber optic communications 1.6-μm range is demonstrated. The approach opens new routes to the fabrication of Si-based RT light emitters.

Citation Download Citation

George Cirlin, Alexander Tonkikh, Vadim Talalaev, Nikolai Zakharov, and Peter Werner "Si/Ge multilayer structures for optoelectronic applications", Proc. SPIE 5946, Optical Materials and Applications, 594610 (13 June 2006); https://doi.org/10.1117/12.639339

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