IR transmission and reflection spectra of C<sub>60</sub>-doped GaAs

Bo Chen; Huahan Zhan; Qihui Wu; Fuchun Xu; Junyong Kang

doi:10.1117/12.676651

23 February 2006 IR transmission and reflection spectra of C₆₀-doped GaAs

Bo Chen, Huahan Zhan, Qihui Wu, Fuchun Xu, Junyong Kang

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61504C (2006) https://doi.org/10.1117/12.676651
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Three kinds of samples, C₆₀ uniformly-doped, δ-doped and C₆₀-Si co-doped GaAs on GaAs(001) substrates are prepared by molecular beam epitaxy. Infrared ray (IR) transmission and reflection measurements(400-4000 cm^-1) have been carried out. The results show similar IR spectra between C₆₀ uniformly-doped and δ-doped GaAs, while C₆₀-Si co-doped GaAs display different optical properties. These phenomena are propably related to the character of C₆₀ adsorption changing from physisorption to chemisorption via variations in surface reconstruction. C₆₀-GaAs and C₆₀-Si bondings may be formed in our samples. In the spectra, it is very difficult to observe direct evidence associated with C₆₀. The C₆₀ in GaAs may have partially decomposed.

Citation Download Citation

Bo Chen, Huahan Zhan, Qihui Wu, Fuchun Xu, and Junyong Kang "IR transmission and reflection spectra of C₆₀-doped GaAs", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504C (23 February 2006); https://doi.org/10.1117/12.676651

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