Paper
28 June 2006 The first high resolution silicon immersion grating spectrograph
Jian Ge, Daniel McDavitt, Bo Zhao, Suvrath Mahadevan, Curtis DeWitt, Sara Seager
Author Affiliations +
Abstract
We report the development of the first high resolution cross-dispersed silicon immersion grating spectrometer. This instrument is called the Florida IR Silicon immersion grating specTrometer (FIRST). FIRST can produce R = 50,000 under a 0.6 arcsec seeing and simultaneously cover 1.3-1.8 μm with a 1kx1k HgCdTe array at the Apache Point Observatory 3.5 meter telescope. FIRST has a 50 mm diameter collimated beam and the overall instrument is within a volume of 0.8x0.5x0.5 m3. The high dispersion, large wavelength coverage and small instrument volume become possible due to the use of a silicon immersion grating (54.7 deg blaze angle and 50 mm diameter entrance pupil) with extremely high dispersion power (3.4 times dispersion power of a conventional echelle) and coarse grooves (16.1 l/mm, coarser than the commercially available echelles). The silicon immersion grating used in a lab bench mounted Czeney-Turner spectrograph with an only 25 mm diameter collimated beam and a 100 um core fiber has produced R = 55,000 cross-dispersed solar spectra. This instrument is designed to precisely measure radial velocities of low mass stars, M dwarfs for detecting 5-10 Earth mass planets. The estimated Doppler precision is ~ 3 m/s for a J = 9 M5V dwarf in 15 min at the APO 3.5m telescope.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Ge, Daniel McDavitt, Bo Zhao, Suvrath Mahadevan, Curtis DeWitt, and Sara Seager "The first high resolution silicon immersion grating spectrograph", Proc. SPIE 6269, Ground-based and Airborne Instrumentation for Astronomy, 62691D (28 June 2006); https://doi.org/10.1117/12.670860
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Cited by 1 scholarly publication.
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KEYWORDS
Planets

Silicon

Doppler effect

Spectrographs

Infrared spectroscopy

Stars

Telescopes

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