Denoising of electrical derivative data of semiconductor lasers based on nonlinear diffusion equation

Fengli Gao; Shuxu Guo; Bibo Lu; Junsheng Cao; Shuang Zhang; Ke Wei

doi:10.1117/12.717154

24 October 2006 Denoising of electrical derivative data of semiconductor lasers based on nonlinear diffusion equation

Fengli Gao, Shuxu Guo, Bibo Lu, Junsheng Cao, Shuang Zhang, Ke Wei

Proceedings Volume 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence; 63572C (2006) https://doi.org/10.1117/12.717154
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

The method of screening semiconductor lasers by using electrical derivative technique is described in detail. The nonlinear diffusion equation is applied to denoising of electrical derivative data according to its denoising theory in signal processing. The denoising experiments of electrical derivative data for several dozens semiconductor lasers indicate that the denoising method can effectively reduce the noise in electrical derivative data and the errors of the measured parameters. The farther experiments indicate that the accurate estimate ratio of the devices can be effectively increased by using the measured parameters which have been denoised, to estimate the quality and reliability of semiconductor lasers.

Citation Download Citation

Fengli Gao, Shuxu Guo, Bibo Lu, Junsheng Cao, Shuang Zhang, and Ke Wei "Denoising of electrical derivative data of semiconductor lasers based on nonlinear diffusion equation", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572C (24 October 2006); https://doi.org/10.1117/12.717154

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KEYWORDS

Denoising

Diffusion

Semiconductor lasers

Reliability

Signal processing

Nonlinear optics

Error analysis

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