Paper
6 November 2006 Application of miniature interferometers in nanomeasuring and positioning technology
Jinping Chen, Tong Guo, Xing Fu, Xiaotang Hu
Author Affiliations +
Abstract
In this article, a work on applying miniature interferometers in nano measuring and positioning system will be introduced. Several types of miniature interferometers, including corner-cube-retroreflector ones, plane-mirror-retroreflector ones and their derivations, will be described. Based on the single-beam plane-mirror interferometers, the triaxial metric system of a Nano Positioning and Measuring Machine (NPMM) is set up. In a working space of 25 mm x 25 mm x 5 mm, the system obeys the "Abbe Principle" to the maximum, having a resolution of 0.1 nm and an uncertainty of measurement of 5 nm - 10 nm.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jinping Chen, Tong Guo, Xing Fu, and Xiaotang Hu "Application of miniature interferometers in nanomeasuring and positioning technology", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63574A (6 November 2006); https://doi.org/10.1117/12.717309
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometers

Mirrors

Retroreflectors

Sensors

Beam splitters

Computer programming

Laser stabilization

RELATED CONTENT

Three-Dimensional Interferometer System
Proceedings of SPIE (April 03 1989)
Status of VIRGO
Proceedings of SPIE (September 29 2004)

Back to Top