A CTE matched, hard solder, passively cooled laser diode package combined with nXLT facet passivation enables high power, high reliability operation

Aaron Hodges; Jun Wang; Mark DeFranza; Xingsheng Liu; Bill Vivian; Curt Johnson; Paul Crump; Paul Leisher; Mark DeVito; Robert Martinsen; Jacob Bell

doi:10.1117/12.730700

10 May 2007 A CTE matched hard solder passively cooled laser diode package combined with nXLT facet passivation enables high power, high reliability operation

Aaron Hodges, Jun Wang, Mark DeFranza, Xingsheng Liu, Bill Vivian, Curt Johnson, Paul Crump, Paul Leisher, Mark DeVito, Robert Martinsen, Jacob Bell

Author Affiliations +

Proceedings Volume 6552, Laser Source Technology for Defense and Security III; 65521E (2007) https://doi.org/10.1117/12.730700
Event: Defense and Security Symposium, 2007, Orlando, Florida, United States

Abstract

A conductively cooled laser diode package design with hard AuSn solder and CTE matched sub mount is presented. We discuss how this platform eliminates the failure mechanisms associated with indium solder. We present the problem of catastrophic optical mirror damage (COMD) and show that nLight's nXLT^TM facet passivation technology effectively eliminates facet defect initiated COMD as a failure mechanism for both single emitter and bar format laser diodes. By combining these technologies we have developed a product that has high reliability at high powers, even at increased operation temperatures. We present early results from on-going accelerated life testing of this configuration that suggests an 808nm, 30% fill factor device will have a MTTF of more than 21khrs at 60W CW, 25°C operating conditions and a MTTF of more than 6.4khrs when operated under hard pulsed (1 second on, 1 second off) conditions.

Citation Download Citation

Aaron Hodges, Jun Wang, Mark DeFranza, Xingsheng Liu, Bill Vivian, Curt Johnson, Paul Crump, Paul Leisher, Mark DeVito, Robert Martinsen, and Jacob Bell "A CTE matched hard solder passively cooled laser diode package combined with nXLT facet passivation enables high power, high reliability operation", Proc. SPIE 6552, Laser Source Technology for Defense and Security III, 65521E (10 May 2007); https://doi.org/10.1117/12.730700

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available