Localized recording approaches and phase metrology for holographic storage

Robert R. McLeod; Matthew W. Grabowski; Mark R. Ayres; Amy C. Sullivan

doi:10.1117/12.738585

11 July 2007 Localized recording approaches and phase metrology for holographic storage

Robert R. McLeod, Matthew W. Grabowski, Mark R. Ayres, Amy C. Sullivan

Proceedings Volume 6620, Optical Data Storage 2007; 66200C (2007) https://doi.org/10.1117/12.738585
Event: Optical Data Storage 2007, 2007, Portland, OR, United States

Abstract

The number of layers of a micro-holographic disk is limited by wavefront aberration which is strongly dependent on the photopolymer initiation, termination and inhibition kinetics. 3D metrology is used to validate predicted index profiles.

Citation Download Citation

Robert R. McLeod, Matthew W. Grabowski, Mark R. Ayres, and Amy C. Sullivan "Localized recording approaches and phase metrology for holographic storage", Proc. SPIE 6620, Optical Data Storage 2007, 66200C (11 July 2007); https://doi.org/10.1117/12.738585

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