MCT epitaxial layers characterization from IR transmittance spectra

K. O. Boltar; N. I. Yakovleva

doi:10.1117/12.742296

26 April 2007 MCT epitaxial layers characterization from IR transmittance spectra

K. O. Boltar, N. I. Yakovleva

Proceedings Volume 6636, 19th International Conference on Photoelectronics and Night Vision Devices; 663606 (2007) https://doi.org/10.1117/12.742296
Event: 19th International Conference on Photoelectronics and Night Vision Devices, 2006, Moscow, Russian Federation

Abstract

Transmittance spectra of epitaxial layers grown on the basis of mercury and cadmium telluride (MCT) alloys have been measured within the wavelength number range of (5000 cm^-1<ν<500 cm^-1). P-type epitaxial layers were grown both by liquid-phase epitaxy method (LPE) on CdZnTe substrates and molecular-beam epitaxy (MBE) on GaAs substrates. The MCT layer parameters such as epitaxial layer thickness d, cutoff wavelength λ₀₅, composition x were calculated from the spectra. JR transmittance spectra simulation method was developed to determine the semiconductor multilayer structures characteristics. Fourier Transform (FT) method was suggested to determine the thickness of MCT epitaxial layers.

Citation Download Citation

K. O. Boltar and N. I. Yakovleva "MCT epitaxial layers characterization from IR transmittance spectra", Proc. SPIE 6636, 19th International Conference on Photoelectronics and Night Vision Devices, 663606 (26 April 2007); https://doi.org/10.1117/12.742296

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