Paper
26 February 2008 Real-time line scan extraction from infrared images using the wedge method in industrial environments
Rubén Usamentiaga, Daniel F. García, Julio Molleda
Author Affiliations +
Proceedings Volume 6813, Image Processing: Machine Vision Applications; 68130R (2008) https://doi.org/10.1117/12.765579
Event: Electronic Imaging, 2008, San Jose, California, United States
Abstract
Infrared imaging is based on the measurement of the radiation of an object and its conversion to temperature. A very important parameter of the conversion procedure is emissivity, which defines the capability of a material to absorb and radiate energy. For most applications, emissivity is assumed to be constant. However, when infrared images are taken from steel strips in an industrial environment, where the measurement is influenced by thermal reflections of surrounding objects, the consideration of emissivity as a constant can lead to large errors in temperature measurement. To overcome problems generated by variations in emissivity, one solution is to measure temperature where the steel strip forms a wedge, acting as a cavity. In the deepest part of the wedge, emissivity is 1, making the emissivity problems disappear. This work presents a real-time image processing system to acquire infrared line scans for steel strips using the wedge method. The proposed system deals with two main problems: infrared line scans must be extracted in real-time from the deepest part of the wedge in the rectangular infrared images, and pixels belonging to the line scan must be translated to real-world units.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rubén Usamentiaga, Daniel F. García, and Julio Molleda "Real-time line scan extraction from infrared images using the wedge method in industrial environments", Proc. SPIE 6813, Image Processing: Machine Vision Applications, 68130R (26 February 2008); https://doi.org/10.1117/12.765579
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CITATIONS
Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Infrared radiation

Infrared imaging

Temperature metrology

Hough transforms

Calibration

Infrared cameras

Cameras

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