Research on the image multilayer matching comparison method in PCB defects inspection

Xi Zhou; Yunsheng Li; Guozhong Liu

doi:10.1117/12.807514

13 October 2008 Research on the image multilayer matching comparison method in PCB defects inspection

Xi Zhou, Yunsheng Li, Guozhong Liu

Proceedings Volume 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration; 71290D (2008) https://doi.org/10.1117/12.807514
Event: Seventh International Symposium on Instrumentation and Control Technology, 2008, Beijing, China

Abstract

In the real-time inspection technology of the printed circuit board (PCB), the matching comparison method is widely used with its simple and easy algorithm to implement. However it has kinds of flaws such as high rate of false report and mutually disturbs among different patterns in comparing process. Therefore this research improved the conventional matching comparison method, proposed the multilayer matching comparison method that based on the multi-threshold values partition image, enhanced the PCB inspection accuracy and reduced the phenomenon of false report. This technique is especially suitable for the inspection of PCB image that has complex gray-levels and multimodal histogram, and can also preliminarily classify the defects according to the partition layers processing.

Citation Download Citation

Xi Zhou, Yunsheng Li, and Guozhong Liu "Research on the image multilayer matching comparison method in PCB defects inspection", Proc. SPIE 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration, 71290D (13 October 2008); https://doi.org/10.1117/12.807514

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