PROCEEDINGS VOLUME 7432
SPIE OPTICAL ENGINEERING + APPLICATIONS | 2-6 AUGUST 2009
Optical Inspection and Metrology for Non-Optics Industries
Editor Affiliations +
Proceedings Volume 7432 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
2-6 August 2009
San Diego, California, United States
Front Matter: Volume 7432
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743201 (2009) https://doi.org/10.1117/12.837052
Calibration and Analysis Methods I: Calibration
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743202 (2009) https://doi.org/10.1117/12.823829
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743203 (2009) https://doi.org/10.1117/12.827057
Hideki Komagata, Ikuo Ishii, Hideo Makino, Akira Takahashi, Daisuke Wakatsuki
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743204 (2009) https://doi.org/10.1117/12.825586
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743205 (2009) https://doi.org/10.1117/12.825753
X. M. Du, T. Chen, X. J. Zou, K. G. Harding
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743206 (2009) https://doi.org/10.1117/12.828891
Yasuhiko Arai, M. Ando, S. Yokozeki
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743207 (2009) https://doi.org/10.1117/12.828518
Calibration and Analysis Methods II: Data Analysis
Pu Cao, Jiangtao Xi, Joe F. Chicharo, Yanguang Yu
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743208 (2009) https://doi.org/10.1117/12.824845
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743209 (2009) https://doi.org/10.1117/12.825663
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320A (2009) https://doi.org/10.1117/12.825194
Lianhua Jin, Kuniharu Takizawa
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320B (2009) https://doi.org/10.1117/12.828030
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320C (2009) https://doi.org/10.1117/12.828890
Optical Metrology and 3D Applications I
Hongwei Zhang, Reuven Katz, John S. Agapiou
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320D (2009) https://doi.org/10.1117/12.824387
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320E (2009) https://doi.org/10.1117/12.825072
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320F (2009) https://doi.org/10.1117/12.825091
Optical Metrology and 3D Applications II
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320H (2009) https://doi.org/10.1117/12.823157
Osami Sasaki, Ryota Yamamura, Kazushi Yokoyama, Takamasa Suzuki
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320J (2009) https://doi.org/10.1117/12.827352
Pankaj Kumar, Akhil Thomas, R. Stephen Weis, Tristan J. Tayag
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320K (2009) https://doi.org/10.1117/12.828498
Maik Rahlves, Sahar Mirzaei, Thomas Fahlbusch, Eduard Reithmeier
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320L (2009) https://doi.org/10.1117/12.825254
3D Methods I: Structured Light and Phase Methods
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320N (2009) https://doi.org/10.1117/12.823903
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320O (2009) https://doi.org/10.1117/12.825793
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320P (2009) https://doi.org/10.1117/12.825980
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320S (2009) https://doi.org/10.1117/12.827416
3D Methods II: Speckle, Holographic, and Dynamic Methods
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320T (2009) https://doi.org/10.1117/12.825766
Thomas D. Ditto, Jim Knapp, Shoshana Biro
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320V (2009) https://doi.org/10.1117/12.826574
Michael North Morris, Tim Horner, Markar Naradikian, Joe Shiefman
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320W (2009) https://doi.org/10.1117/12.827090
3D Methods III: Other Methods Including Color, Stereo, and Focus
Xu Han, Peisen Huang, Zhicheng Deng, Leon Xu
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320X (2009) https://doi.org/10.1117/12.828228
Jens Siepmann, Matthias Heinze, Peter Kühmstedt, Gunther Notni
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320Y (2009) https://doi.org/10.1117/12.827053
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74320Z (2009) https://doi.org/10.1117/12.826902
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743210 (2009) https://doi.org/10.1117/12.827028
Xu Han, Peisen Huang, Zhicheng Deng, Leon Xu
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743211 (2009) https://doi.org/10.1117/12.829284
Gil Abramovich, Kevin Harding, Vijay Paruchuru, Swaminathan Manickam, Christopher Nafis, Joseph Czechowski, Arun Vemury
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743212 (2009) https://doi.org/10.1117/12.828805
Jürgen W. Czarske, Thorsten Pfister, Philipp Günther, Lars Büttner
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743213 (2009) https://doi.org/10.1117/12.826520
Poster Session
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743214 (2009) https://doi.org/10.1117/12.826178
Amalia Martínez García, Juan Antonio Rayas-Alvarez, Héctor José Puga Soberanes, Katia Genovese
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743216 (2009) https://doi.org/10.1117/12.825658
Chih-Shang Liu, Kai-Ping Chuang, Yeo-Sung Lin, Ming-Yin Zhuang, Chih-Jung Chiang
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743217 (2009) https://doi.org/10.1117/12.827084
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 743218 (2009) https://doi.org/10.1117/12.824681
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74321A (2009) https://doi.org/10.1117/12.824662
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74321B (2009) https://doi.org/10.1117/12.824393
Proceedings Volume Optical Inspection and Metrology for Non-Optics Industries, 74321C (2009) https://doi.org/10.1117/12.830444
Back to Top