Paper
28 December 2010 Characterization scattering parameters of coaxial air-lines by physical measurements
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75445X (2010) https://doi.org/10.1117/12.885757
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
Precision through-lines, coaxial airlines, are the most accurate microwave impedance standards. They are widely applied in the TRL calibration method. The air-lines are also important standards which are used to test network analyzer systems. In addition, the scattering parameter and uncertainty of coaxial air-line are important for improving the accuracy of VNA. However, the conventional microwave measurement systems have limitations in observing and obtaining accurate information of the performance of coaxial air-lines. In this paper, a new approach is proposed that determines microwave scattering parameter by physical components and assumed models. Experimental results demonstrate the efficacy of the proposed algorithm in comparison to the experimental results obtained from microwave measurement. In addition, the estimated uncertainty is also presented.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
HanChen Liang "Characterization scattering parameters of coaxial air-lines by physical measurements", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445X (28 December 2010); https://doi.org/10.1117/12.885757
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microwave radiation

Scattering

Calibration

Network security

Phase shifts

Signal attenuation

Statistical analysis

RELATED CONTENT

Millimeter-Wave Six-Ports
Proceedings of SPIE (October 24 1985)
Hybrid Modeling Of Staring Planar Arrays
Proceedings of SPIE (March 17 1983)

Back to Top