Investigation of aberrations of Kirkpatrick-Baez mirrors

Bodo Ehlers; Boris Verman

doi:10.1117/12.859850

27 August 2010 Investigation of aberrations of Kirkpatrick-Baez mirrors

Bodo Ehlers, Boris Verman

Proceedings Volume 7802, Advances in X-Ray/EUV Optics and Components V; 78020F (2010) https://doi.org/10.1117/12.859850
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

The flux distributions in the focal plane of Kirkpatrick-Baez optics are investigated as the parameters of the focusing ellipse of the mirrors are changed from typical laboratory optics to synchrotron beam line optics. This work shows the effects of the most predominant focusing imperfections that arise from conditions that violate the original assumptions of Kirkpatrick-Baez systems, including orthogonality of the mirror surfaces and paraxial rays.

Citation Download Citation

Bodo Ehlers and Boris Verman "Investigation of aberrations of Kirkpatrick-Baez mirrors", Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 78020F (27 August 2010); https://doi.org/10.1117/12.859850

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