Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy

Li Tao; Kevin Harding; Ming Jia; Guiju Song

doi:10.1117/12.872022

11 November 2010 Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy

Li Tao, Kevin Harding, Ming Jia, Guiju Song

Author Affiliations +

Proceedings Volume 7855, Optical Metrology and Inspection for Industrial Applications; 78550Y (2010) https://doi.org/10.1117/12.872022
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

Structured light based 3D measurement is a typical optic method used to detect surface profile. The primary system projects a structured pattern onto the measured surface. Through the phase shifting analysis, the depth profile is extracted with a high resolution. In this paper a portable device bases on structured light method is introduced. The tool is used to inspect edge breaks and corrosion depth on the turbine system parts. In order to maintain the inspection accuracy under the portable operation, a simple but reliable calibration process and enhancement algorithms are needed to mitigate the variations of user operations and system noise. In this paper, an effective calibration method with simple process is introduced to calculate the system parameters and minimize the measurement errors. A set of image enhancement algorithm designed specially for the structured patterns are introduced that is able to mitigate the noise clearly but won't decrease the measurement resolution. The results are demonstrated through the calibration of a prototype system. Measurement results are presented for sample surface using the filtering. The results show that the calibration process and image enhancement works effectively to maintain a good accuracy and data quality.

Citation Download Citation

Li Tao, Kevin Harding, Ming Jia, and Guiju Song "Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy", Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550Y (11 November 2010); https://doi.org/10.1117/12.872022

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