Paper
15 February 2012 Characterization of orthogonal transfer array CCDs for the WIYN one degree imager
Michael Lesser, David Ouellette, Todd Boroson, Daniel Harbeck, Pierre Martin, George Jacoby, John Cavin, David Sawyer, Kasey Boggs, Richard Bredthauer
Author Affiliations +
Proceedings Volume 8298, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII; 82980O (2012) https://doi.org/10.1117/12.908376
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States
Abstract
The WIYN One Degree Imager (ODI) will provide a one degree field of view for the WIYN 3.5 m telescope located on Kitt Peak near Tucson, Arizona. Its focal plane consists of an 8x8 grid of Orthogonal Transfer Array (OTA) CCD detectors. These detectors are the STA2200 OTA CCDs designed and fabricated by Semiconductor Technology Associates, Inc. and backside processed at the University of Arizona Imaging Technology Laboratory. Several lot runs of the STA2200 detectors have been fabricated. We have backside processed devices from these different lots and provide detector performance characterization, including noise, CTE, cosmetics, quantum efficiency, and some orthogonal transfer characteristics. We discuss the performance differences for the devices with different silicon thickness and resistivity. A fully buttable custom detector package has been developed for this project which allows hybridization of the silicon detectors directly onto an aluminum nitride substrate with an embedded pin grid array. This package is mounted on a silicon-aluminum alloy which provides a flat imaging surface of less than 20 microns peakvalley at the -100 C operating temperature. Characterization of the package performance, including low temperature profilometry, is described in this paper.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Lesser, David Ouellette, Todd Boroson, Daniel Harbeck, Pierre Martin, George Jacoby, John Cavin, David Sawyer, Kasey Boggs, and Richard Bredthauer "Characterization of orthogonal transfer array CCDs for the WIYN one degree imager", Proc. SPIE 8298, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, 82980O (15 February 2012); https://doi.org/10.1117/12.908376
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Charge-coupled devices

Silicon

Logic

Amplifiers

Semiconducting wafers

Quantum efficiency

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