Paper
30 April 2012 Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
V. K. Valev, B. De Clercq, X. Zheng, C. G. Biris, N. C. Panoiu, A. V. Silhanek, V. Volskiy, O. A. Aktsipetrov, G. A. E. Vandenbosch, M. Ameloot, V. V. Moshchalkov, T. Verbiest
Author Affiliations +
Abstract
Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. K. Valev, B. De Clercq, X. Zheng, C. G. Biris, N. C. Panoiu, A. V. Silhanek, V. Volskiy, O. A. Aktsipetrov, G. A. E. Vandenbosch, M. Ameloot, V. V. Moshchalkov, and T. Verbiest "Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials", Proc. SPIE 8424, Nanophotonics IV, 842411 (30 April 2012); https://doi.org/10.1117/12.922880
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KEYWORDS
Second-harmonic generation

Objectives

Nanostructures

Microscopy

Harmonic generation

Plasmonics

Gold

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