Paper
15 October 2012 Uncertainty analysis in lifetime measurement for white light emitting diodes
Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Muqing Liu
Author Affiliations +
Abstract
Lifetime is one of the most important characteristics of white LEDs for the solid state lighting industry and end users. The measurement uncertainties should be controlled well to ensure consistent measurement results. This paper gives uncertainty analysis in the measurement for the L50 lifetime of white LEDs. The exponential model is assumed for LEDs’ light output degradation, and an Eyring model is used for accelerated life test. The influences of photometric measurement instruments, measurement duration and interval, junction temperature, input current, current accelerating index and activation energy are analysed. The analysis method introduced in this paper can be referenced for other related analysis, and the results are important to the practices in LED lifetime measurement.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haiping Shen, Xiaoli Zhou, Wanlu Zhang, and Muqing Liu "Uncertainty analysis in lifetime measurement for white light emitting diodes", Proc. SPIE 8484, Twelfth International Conference on Solid State Lighting and Fourth International Conference on White LEDs and Solid State Lighting, 84840A (15 October 2012); https://doi.org/10.1117/12.930579
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Light emitting diodes

Time metrology

Uncertainty analysis

Optical testing

Solid state lighting

Accelerated life testing

Illumination engineering

Back to Top