Paper
12 March 2013 Depth correction in ToF camera
Byong Min Kang, Keechang Lee, James D. K. Kim, Chang-Yeong Kim
Author Affiliations +
Proceedings Volume 8650, Three-Dimensional Image Processing (3DIP) and Applications 2013; 86500J (2013) https://doi.org/10.1117/12.2005754
Event: IS&T/SPIE Electronic Imaging, 2013, Burlingame, California, United States
Abstract
A depth captured by a Time-of-Flight (ToF) camera is sometimes distorted when object is close to camera. This problem causes low quality in several applications. In this paper, we take saturation of pixel into account and propose how to correct depth regardless of color or distance of objects using multi-integration time and phase reconstruction methods. The ToF camera captures depth of objects by using the ratio of electron charges which is not saturated for each integration time and by using phase summation equality. For verifying our approach, we used our prototype ToF camera with 480x270 pixel resolution, 16MHz modulated frequency, f/1.6 lens and 40msec integration time. Integration times are set by 16msec and 24msec, respectively. And target object used in test is color chart consisting of 24 standard colors and is located at intervals of 25cm (0.75m to 2.00m). We verified depth of each patch in color chart has identical value.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Byong Min Kang, Keechang Lee, James D. K. Kim, and Chang-Yeong Kim "Depth correction in ToF camera", Proc. SPIE 8650, Three-Dimensional Image Processing (3DIP) and Applications 2013, 86500J (12 March 2013); https://doi.org/10.1117/12.2005754
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KEYWORDS
Cameras

Time of flight cameras

Capacitors

Near infrared

Modulation

3D acquisition

3D image processing

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