Paper
14 February 2013 Robust registration of electron tomography projections without fiducial markers
Viet-Dung Tran, Maxime Moreaud, Éric Thiébaut, Loïc Dénis, Jean-Marie Becker
Author Affiliations +
Proceedings Volume 8657, Computational Imaging XI; 86570R (2013) https://doi.org/10.1117/12.2001128
Event: IS&T/SPIE Electronic Imaging, 2013, Burlingame, California, United States
Abstract
A major issue in electron tomography is the misalignment of the projections contributing to the reconstruction. The current alignment techniques currently use fiducial markers such as gold particles. When the use of markers is not possible, the accurate alignment of the projections is a challenge. We describe a new method for the alignment of transmission electron microscopy (TEM) images series without the need of fiducial markers. The proposed approach is composed of two steps. The first step consists of an initial alignment process, which relies on the minimization of a cost function based on robust statistics measuring the similarity of a projection to its previous projections in the series. It reduces strong shifts resulting from the acquisition between successive projections. The second step aligns the projections finely. The issue is formalized as an inverse problem. The pre­ registered projections are used to initialize an iterative alignment-refinement process which alternates between (i) volume reconstructions and (ii) registrations of measured projections onto simulated projections computed from the volume reconstructed in (i). The accuracy of our method is very satisfying; we illustrate it on simulated data and real projections of different zeolite supports catalyst.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Viet-Dung Tran, Maxime Moreaud, Éric Thiébaut, Loïc Dénis, and Jean-Marie Becker "Robust registration of electron tomography projections without fiducial markers", Proc. SPIE 8657, Computational Imaging XI, 86570R (14 February 2013); https://doi.org/10.1117/12.2001128
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KEYWORDS
Reconstruction algorithms

Transmission electron microscopy

Electron tomography

Image registration

Sensors

3D modeling

Inverse problems

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