Photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors

A. J. Nelson; J.-S. Lee; J. A. Stanford; W. K. Grant; L. F. Voss; P. R. Beck; R. T. Graff; E. L. Swanberg; A. M. Conway; R. J. Nikolic; S. A. Payne; H. Kim; L. J Cirignano; K. Shah

doi:10.1117/12.2021675

26 September 2013 Photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors

A. J. Nelson, J.-S. Lee, J. A. Stanford, W. K. Grant, L. F. Voss, P. R. Beck, R. T. Graff, E. L. Swanberg, A. M. Conway, R. J. Nikolic, S. A. Payne, H. Kim, L. J Cirignano, K. Shah

Author Affiliations +

Proceedings Volume 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV; 88520E (2013) https://doi.org/10.1117/12.2021675
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

Device-grade TlBr was subjected to various chemical treatments used in room temperature radiation detector fabrication to determine the resulting surface composition and electronic structure. Samples of as polished TlBr were treated separately with 2%Br:MeOH, 10%HF, 10%HCl and 96%SOCl₂ solutions. High-resolution photoemission measurements on the valence band electronic structure and Tl 4f, Br 3d, Cl 2p and S 2p core lines were used to evaluate surface chemistry. Results suggest anion substitution at the surface with subsequent shallow heterojunction formation. Surface chemistry and valence band electronic structure were further correlated with the goal of optimizing the long-term stability and radiation response.

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A. J. Nelson, J.-S. Lee, J. A. Stanford, W. K. Grant, L. F. Voss, P. R. Beck, R. T. Graff, E. L. Swanberg, A. M. Conway, R. J. Nikolic, S. A. Payne, H. Kim, L. J Cirignano, and K. Shah "Photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors", Proc. SPIE 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV, 88520E (26 September 2013); https://doi.org/10.1117/12.2021675

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