Robustness of digital approach to  mismatch compensation in analog circuits  realized in nanometer technologies

Zbigniew Jaworski; Piotr Wysokiński

doi:10.1117/12.2031697

25 July 2013 Robustness of digital approach to mismatch compensation in analog circuits realized in nanometer technologies

Zbigniew Jaworski, Piotr Wysokiński

Author Affiliations +

Proceedings Volume 8902, Electron Technology Conference 2013; 89020Z (2013) https://doi.org/10.1117/12.2031697
Event: Electron Technology Conference 2013, 2013, Ryn, Poland

Abstract

In this papers, a fully differential operational transconductance amplifier (OTA) implemented in 65 nm CMOS technology is analyzed to determine which component of the calibration circuitry is most susceptible to manufacturing process disturbances and thus impairs robustness of the calibration methodology. The average offset voltage of the OTA can be significantly reduced. It has been shown that effectiveness of the calibration methodology is limited by the offset voltage of the comparator that calculates sign of the OTA offset voltage.

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Zbigniew Jaworski and Piotr Wysokiński "Robustness of digital approach to mismatch compensation in analog circuits realized in nanometer technologies", Proc. SPIE 8902, Electron Technology Conference 2013, 89020Z (25 July 2013); https://doi.org/10.1117/12.2031697

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