Influence and analysis on ion barrier film to the noise factor of micro-channel plate

Yu-feng Zhu; Fan Zhang; Ni Zhang; Jing Nie; Dan Li; Tai-min Zhang; Shu-fei Wang; Xiao-jian Liu; Zhao-lu Liu

doi:10.1117/12.2177782

4 March 2015 Influence and analysis on ion barrier film to the noise factor of micro-channel plate

Yu-feng Zhu, Fan Zhang, Ni Zhang, Jing Nie, Dan Li, Tai-min Zhang, Shu-fei Wang, Xiao-jian Liu, Zhao-lu Liu

Proceedings Volume 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I; 95211E (2015) https://doi.org/10.1117/12.2177782
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China

Abstract

The noise factor, which is the main factor affecting the noise performance of image intensifier and can accurately reflect the noise characteristics of the micro-channel plate(MCP), is the ratio of the input signal to noise ratio (SNR) and the output SNR. According to definition of noise factor of micro channel plate, noise mechanism and test principle, noise factor of filmed MCP test system is established in order to study the technical way to reduce noise factor of MCP. Because the input surface of the MCP is covered with ion barrier film to block the feedback ions, which have a great impact on the noise factor of the MCP. Hence, noise factor of filmed MCP and un-filmed MCP is measured respectively, and noise factors with different materials and different filmed thickness are measured too. Relationships between noise factor and filmed thickness, noise factor and output SNR of image intensifier have been obtained. That is valuable to reduce the noise of filmed MCP.

Citation Download Citation

Yu-feng Zhu, Fan Zhang, Ni Zhang, Jing Nie, Dan Li, Tai-min Zhang, Shu-fei Wang, Xiao-jian Liu, and Zhao-lu Liu "Influence and analysis on ion barrier film to the noise factor of micro-channel plate", Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 95211E (4 March 2015); https://doi.org/10.1117/12.2177782

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