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The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), “Title of Paper,” in Applied Advanced Optical Metrology Solutions, edited by Erik Novak, James D. Trolinger, Proceedings of SPIE Vol. 9576 (SPIE, Bellingham, WA, 2015) Article CID Number. ISSN: 0277-786X ISBN: 9781628417425 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2015, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Anderson, Erik H., 08 Ao, Lei, 0L Arai, H., 0N Arai, Y., 06 Artemiev, Nikolay A., 08 Babin, Sergey, 08 Barber, Zeb W., 0H Bernacki, Bruce E., 04 Boettcher, T., 09 Brasseur, Jason K., 0I Buckner, Benjamin D., 0C, 0E Bui, Son, 07 Burnham-Fay, E. D., 0F Cabrini, Stefano, 08 Calafiore, Guiseppe, 08 Cannon, Bret D., 04 Chan, Elaine R., 08 Compertore, David C., 0M Crouch, Stephen, 0H Dannenberg, Florian, 02 Doi, K., 0N Dong, Xin, 0L Ellis, J. D., 0F Froehly, L., 09 Gorecki, C., 09 Gronle, M., 09 Hahlweg, Cornelius, 02 Heist, Stefan, 05 Ignatovich, Filipp V., 0M Jacobs-Perkins, D. W., 0F Józwik, Michał, 0Q Kaylor, Brant M., 0H Kimbrough, Brad, 03 Kondo, K., 0N Körner, K., 09 Krauter, J., 09 Kühmstedt, Peter, 05 Kujawińska, Małgorzata, 0Q Lacey, Ian, 08 Leger, James R., 0G L'Esperance, Drew, 0C, 0E Li, Jie, 0P Liang, Jin, 0D, 0P Lin, Di, 0G Liu, Yongqi, 0L Liu, Zhigang, 0V Lutzke, Peter, 05 Maehara, S., 0N Marcus, Michael A., 0M McKinney, Wayne R., 08 Mendoza, Albert, 04 Notni, Gunther, 05 Novak, Erik, 03 Novak, Matt, 07 Ohdaira, Y., 0N Ohkawa, M., 0N Osten, W., 09 Passilly, N., 09 Peroz, Christophe, 08 Perrin, S., 09 Pescoller, Lukas, 02 Reibel, Randy R., 0H Ren, Maodong, 0D, 0P Roos, Peter A., 0I Saito, T., 0N Sakamoto, S., 0N Sato, T., 0N Schiffern, John T., 04 Schmit, Joanna, 07 Takacs, Peter Z., 08 Tao, Long, 0V Thorpe, Michael J., 0I Tokutake, Y., 0N Trolinger, James D., 0C, 0E Wang, Lizhong, 0D Wei, Bin, 0D, 0P Weiß, Jürgen, 02 Yashchuk, Valeriy V., 08 Żak, Jakub, 0Q Zhang, Weibo, 0V Zhang, Ze, 0L Conference CommitteeProgram Track Chair Conference Chairs
Conference Program Committee
Session Chairs
IntroductionThe methods of optical metrology have advanced significantly since the times of the early interferometers of the late 19th century. Fast cameras and processing make a whole range of new methods available today for looking at everything from fine microstructures to large astronomical systems. This conference was designed to focus on optical methods beyond traditional white-light or monochromatic-laser interferometric methods to other means of making precision measurements as well as the many applications made possible by these advances. An emphasis was placed on discussions on how metrology helps solve critical problems and answer key questions in both science and industry. We had many excellent contributions to the 2015 conference, our inaugural year. Papers fit into four main application categories: surface measurements; techniques for system performance characterization and enhancement; strain, flow, and gradient measurements; and finally volumetric and distance-based methods. Many optical metrology techniques were discussed, including Schlieren imaging, superresolution methods, Moire and fringe projection, dynamic interferometry, spectroscopic methods, multiple-wavelength interferometry, speckle systems, high-precision LADAR, and color-based techniques. Each technique can help solve unique problems, and all are advancing rapidly as the demands for precision metrology steadily increase as cost, lifetime, and performance needs become ever more challenging. Erik Novak James D. Trolinger |
