A measurement methodology for dynamic angle of sight errors in hardware-in-the-loop simulation

Wen-pan Zhang; Jun-hui Wu; Lin Gan; Hong-peng Zhao; Wei-wei Liang

doi:10.1117/12.2199077

8 October 2015 A measurement methodology for dynamic angle of sight errors in hardware-in-the-loop simulation

Wen-pan Zhang, Jun-hui Wu, Lin Gan, Hong-peng Zhao, Wei-wei Liang

Proceedings Volume 9677, AOPC 2015: Optical Test, Measurement, and Equipment; 96770T (2015) https://doi.org/10.1117/12.2199077
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China

Abstract

In order to precisely measure dynamic angle of sight for hardware-in-the-loop simulation, a dynamic measurement methodology was established and a set of measurement system was built. The errors and drifts, such as synchronization delay, CCD measurement error and drift, laser spot error on diffuse reflection plane and optics axis drift of laser, were measured and analyzed. First, by analyzing and measuring synchronization time between laser and time of controlling data, an error control method was devised and lowered synchronization delay to 21μs. Then, the relationship between CCD device and laser spot position was calibrated precisely and fitted by two-dimension surface fitting. CCD measurement error and drift were controlled below 0.26mrad. Next, angular resolution was calculated, and laser spot error on diffuse reflection plane was estimated to be 0.065mrad. Finally, optics axis drift of laser was analyzed and measured which did not exceed 0.06mrad. The measurement results indicate that the maximum of errors and drifts of the measurement methodology is less than 0.275mrad. The methodology can satisfy the measurement on dynamic angle of sight of higher precision and lager scale.

Citation Download Citation

Wen-pan Zhang, Jun-hui Wu, Lin Gan, Hong-peng Zhao, and Wei-wei Liang "A measurement methodology for dynamic angle of sight errors in hardware-in-the-loop simulation", Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770T (8 October 2015); https://doi.org/10.1117/12.2199077

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KEYWORDS

Charge-coupled devices

Reflection

Error analysis

Beam controllers

Control systems

Calibration

Pulsed laser operation

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