Characterization and modeling of radiation damages via internal radiative efficiency in multi-junction solar cells

Lin Zhu; Masahiro Yoshita; Tetsuya Nakamura; Mitsuru Imaizumi; Changsu Kim; Toshimitsu Mochizuki; Shaoqiang Chen; Yoshihiko Kanemitsu; Hidefumi Akiyama

doi:10.1117/12.2212827

14 March 2016 Characterization and modeling of radiation damages via internal radiative efficiency in multi-junction solar cells

Lin Zhu, Masahiro Yoshita, Tetsuya Nakamura, Mitsuru Imaizumi, Changsu Kim, Toshimitsu Mochizuki, Shaoqiang Chen, Yoshihiko Kanemitsu, Hidefumi Akiyama

Author Affiliations +

Proceedings Volume 9743, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V; 97430U (2016) https://doi.org/10.1117/12.2212827
Event: SPIE OPTO, 2016, San Francisco, California, United States

Abstract

In order to understand the radiation effects in space-used multi-junction solar cells, we characterized degradations of internal radiative efficiency (η_{int i} ) in respective subcells in InGaP/GaAs double-junction solar cells after 1-MeV electron irradiations with different electrons fluences (Φ) via absolute electroluminescence (EL) measurements, because η_{int i} purely represents material-quality change due to radiation damage, independently from cell structures. We analyzed the degradation of η_{int i} under different Φ and found that the data of η_{int i} versus Φ in moderate and high Φ regions are very similar and almost independent of subcell materials, while the difference in beginning-of-life qualities of InGaP and GaAs materials causes dominant difference in sub-cell sensitivity to the low radiation damages. Finally, a simple model was proposed to explain the mechanism in degradation of η_{int i}, and also well explained the degradation behavior in open-circuit voltage for these multi-junction solar cells.

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Lin Zhu, Masahiro Yoshita, Tetsuya Nakamura, Mitsuru Imaizumi, Changsu Kim, Toshimitsu Mochizuki, Shaoqiang Chen, Yoshihiko Kanemitsu, and Hidefumi Akiyama "Characterization and modeling of radiation damages via internal radiative efficiency in multi-junction solar cells", Proc. SPIE 9743, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V, 97430U (14 March 2016); https://doi.org/10.1117/12.2212827

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