Paper
21 March 2016 Novel neutral under layer materials to enhance the photolithography performance and defectivity for chemo-epitaxy process
Ryuta Mizuochi, Hiroyuki Wakayama, Yasunobu Someya, Rikimaru Sakamoto
Author Affiliations +
Abstract
Neutral layer (NL) material is one of the key materials for aligning block-co-polymer (BCP). In this study, NLs were designed and investigated, which have the capability to enhance the photo-lithography performance, a good alignment performance of BCP, and reduce the defectivity after chemo-epitaxy process. In order to enhance the photo-lithography performance, some new polymers were prepared with chromophores to control n/k value and adhesive unit interacted with the photo resist. The surface energy of these materials was adjusted to the neutral for BCP by controlling the ratio of chromophore and adhesion unit. The defects were also investigated and achieved low defectivity by optimized materials. Since this material has the above properties, it shows a good perpendicularly alignment pattern of BCP and a photolithography performance.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryuta Mizuochi, Hiroyuki Wakayama, Yasunobu Someya, and Rikimaru Sakamoto "Novel neutral under layer materials to enhance the photolithography performance and defectivity for chemo-epitaxy process", Proc. SPIE 9779, Advances in Patterning Materials and Processes XXXIII, 97791Z (21 March 2016); https://doi.org/10.1117/12.2219005
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Lithography

Polymers

Silicon

Semiconducting wafers

Image processing

Coating

Optical lithography

RELATED CONTENT


Back to Top