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5 March 2022 Beam deflection characterization of nonlinear TCOs at ENZ
Adam Ball, Ray Secondo, Dhruv Fomra, Vitaly Avrutin, Umit Ozgur, Nate Kinsey
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Proceedings Volume PC12002, Oxide-based Materials and Devices XIII; PC120020V (2022) https://doi.org/10.1117/12.2623600
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
Recently, transparent conducting oxides such as indium tin oxide and aluminum-doped zinc oxide have been characterized in their epsilon-near-zero crossover regions due to their strong enhancement of light-matter interaction. A newer technique, known as beam deflection, can be used to enable single-detector measurements that characterizes the complex nonlinear refractive index by detecting the angular deflection and transmission of a probe beam. Here we describe two key nonidealities in beam deflection measurements, 1) the spatio-temporal interaction of the beams with a finite relative angular separation, 2) the apparent angular deviation occurring due to strong spatially non-uniform absorption.
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Adam Ball, Ray Secondo, Dhruv Fomra, Vitaly Avrutin, Umit Ozgur, and Nate Kinsey "Beam deflection characterization of nonlinear TCOs at ENZ", Proc. SPIE PC12002, Oxide-based Materials and Devices XIII, PC120020V (5 March 2022); https://doi.org/10.1117/12.2623600
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KEYWORDS
Transparent conducting oxide
Oxides
Optical testing
Indium
Laser beam diagnostics
Light-matter interactions
Refractive index
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