Transient phenomena analysis using dynamic speckle patterns

Hector Jorge Rabal; Ricardo A. Arizaga; Nelly Lucia Cap; Marcelo Trivi; Graciela Romero; Elvio Alanis

doi:10.1117/1.600789

1 January 1996 Transient phenomena analysis using dynamic speckle patterns

Hector Jorge Rabal, Ricardo A. Arizaga, Nelly Lucia Cap, Marcelo Trivi, Graciela Romero, Elvio Alanis

Author Affiliations +

Optical Engineering, Vol. 35, Issue 1, (January 1996). https://doi.org/10.1117/1.600789

Abstract

The full width at half maximum is sometimes used to characterize the autocorrelation function of the time history of a speckle pattern. We propose to include more autocorrelation points to diminish the variability of the measurement. The width of the equivalent rectangle (WER) and the X* LOG X measurements are defined and some simulations and experimental results obtained are shown.

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Hector Jorge Rabal, Ricardo A. Arizaga, Nelly Lucia Cap, Marcelo Trivi, Graciela Romero, and Elvio Alanis "Transient phenomena analysis using dynamic speckle patterns," Optical Engineering 35(1), (1 January 1996). https://doi.org/10.1117/1.600789

Published: 1 January 1996

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