Evaluation of hydroxyl content in commercial X-cut LiNbO3 wafers for optical waveguide devices

Hirotoshi Nagata

doi:10.1117/1.601675

1 May 1998 Evaluation of hydroxyl content in commercial X-cut LiNbO3 wafers for optical waveguide devices

Hirotoshi Nagata

Optical Engineering, Vol. 37, Issue 5, (May 1998). https://doi.org/10.1117/1.601675

Usually the quality of commercial LiNbO3 (LN) wafers is checked by their crystalline homogeneity. In X cut wafers, which are labeled for optical waveguide applications, however, the existence of a significant change in the hydroxyl content along the polarized Z axis is found by Fourier transform IR (FTIR) spectrometry, although a corresponding inhomogeneity was not observed about the lattice parameters, the Li and Nb contents, and the optical birefringence parameters. Such a difference in hydroxyl content might influence quality and stability of the obtained waveguides, and one should consider this before designing waveguide devices and fabrication processes.

Citation Download Citation

Hirotoshi Nagata "Evaluation of hydroxyl content in commercial X-cut LiNbO3 wafers for optical waveguide devices," Optical Engineering 37(5), (1 May 1998). https://doi.org/10.1117/1.601675

Published: 1 May 1998

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available