1 February 2005 Modification of the spectral response of a Fabry-Perot etalon by spatial variation of the etalon thickness and reflectivity
John W. Arkwright, Roger Pryce Netterfield, Wayne Stuart, Jeffrey A. Seckold
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Abstract
A technique is described for modifying the spectral profile of a Fabry-Perot etalon by introducing a spatial variation to the etalon thickness and reflectivity. The viability of the technique is demonstrated by grinding and polishing a solid lithium niobate etalon to give a controlled thickness variation. A flat-topped transmission profile is generated from the measured thickness map, and further modification of the profile is predicted by introducing customized variations in thickness and reflectivity of the etalon mirrors
©(2005) Society of Photo-Optical Instrumentation Engineers (SPIE)
John W. Arkwright, Roger Pryce Netterfield, Wayne Stuart, and Jeffrey A. Seckold "Modification of the spectral response of a Fabry-Perot etalon by spatial variation of the etalon thickness and reflectivity," Optical Engineering 44(2), 024001 (1 February 2005). https://doi.org/10.1117/1.1839891
Published: 1 February 2005
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KEYWORDS
Fabry–Perot interferometers

Reflectivity

Mirrors

Polishing

Lithium niobate

Semiconducting wafers

Optical engineering

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