Light-emitting-diode inspection using a flatbed scanner

Han-Yen Tan; Tuck Wah Ng

doi:10.1117/1.2995991

1 October 2008 Light-emitting-diode inspection using a flatbed scanner

Han-Yen Tan, Tuck Wah Ng

Author Affiliations +

Optical Engineering, Vol. 47, Issue 10, 103602 (October 2008). https://doi.org/10.1117/1.2995991

Abstract

There is a need to ensure that light-emitting diodes (LEDs) are performing well as they are increasingly used in demanding applications. In this work, we present an adapted usage of flatbed scanners to inspect LEDs. This offers the benefits of lower cost and higher measurement throughput than specialized equipment like goniophotometers. The technique is demonstrated to detect LED encapsulation defects, to identify low illumination and misaligned LEDs in arrays, and to evaluate angular color nonuniformity of white LEDs.

©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Han-Yen Tan and Tuck Wah Ng "Light-emitting-diode inspection using a flatbed scanner," Optical Engineering 47(10), 103602 (1 October 2008). https://doi.org/10.1117/1.2995991

Published: 1 October 2008

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