Blind deconvolution of x-ray diffraction profiles by using high-order statistics

Jinghe Yuan

doi:10.1117/1.3159868

1 July 2009 Blind deconvolution of x-ray diffraction profiles by using high-order statistics

Jinghe Yuan

Author Affiliations +

Optical Engineering, Vol. 48, Issue 7, 076501 (July 2009). https://doi.org/10.1117/1.3159868

Abstract

A high-order statistical-based, blind deconvolution algorithm is proposed for x-ray powder diffraction profiles. Maximizing the kurtosis amplitude of the deconvolved data ensures that only the data with maximized kurtosis amplitude is extracted. The ill-posed nature of deconvolution is, thus, bypassed. Using simulation and experiments, this method is seen to be very robust with respect to noise. The profile resolution is enhanced considerably, and the deconvolved profile fits the pseudo-Voigt profile nicely. However, noise is enhanced in the deconvolved data, so the algorithm may be invalid for experimental data with low signal-to-noise.

©(2009) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Jinghe Yuan "Blind deconvolution of x-ray diffraction profiles by using high-order statistics," Optical Engineering 48(7), 076501 (1 July 2009). https://doi.org/10.1117/1.3159868

Published: 1 July 2009

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available