Mr. Alan Richard Kramer Profile

Alan Richard Kramer

Applications Engineer

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Publications (3)

Proceedings Article | 6 March 2021 Presentation

Band alignment of ScxAl1-xN/GaN heterojunctions

Eric Jin, Matthew Hardy, Alyssa Mock, John Lyons, Alan Kramer, Marko Tadjer, Neeraj Nepal, D. Scott Katzer, David Meyer

Proceedings Volume 11686, 1168622 (2021) https://doi.org/10.1117/12.2579042

KEYWORDS: Heterojunctions, Gallium nitride, X-rays, Photoemission spectroscopy, Molecular beam epitaxy, Ellipsometry

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Proceedings Article | 29 September 2004 Paper

Characterization of C70 doped poly(styrene) –b- poly(hexyl methacrylate) (PS-PHMA) thin film on c–Si substrate with a Jobin Yvon UVISEL phase- modulated spectroscopic ellipsometer (PMSE).

Alan Kramer, Nan Yao, Vincent Pelletier

Proceedings Volume 5527, (2004) https://doi.org/10.1117/12.559705

KEYWORDS: Data modeling, Thin films, Solids, Silicon, Polymers, Anisotropy, Modulation, Spectroscopy, Carbon, Doping

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Proceedings Article | 18 June 2004 Paper

Measurement of organic/polymer material by phase modulation ellipsometry

Yong Ji, Eric Teboul, Alan Kramer

Proceedings Volume 5351, (2004) https://doi.org/10.1117/12.529365

KEYWORDS: Glasses, Polymers, Thin films, Liquid crystals, Refractive index, Phase modulation, Optical properties, Ellipsometry, Polymer thin films, Doping

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