We investigate ways to improve image resolution and contrast in scatter-plate microscopy by image deconvolution and speckle pattern manipulation. Scatter-plate microscopy uses a single diffusively scattering element instead of a complex lens system to record high resolution images with almost arbitrary magnification. The image of the sample is acquired by cross-correlating the speckle pattern of a point source and the speckle pattern of the incoherently illuminated sample. The working principle is restricted by the finite range of the optical memory effect and by the quality of the light source used to approximate a point source (in our case a single mode fibre). With a deconvolution method using the autocorrelation of the point source speckle pattern as the filter function, describing the relationship between the acquired image and the original object, it is possible to compensate partially the deviation of the used point source from an ideal one. The influence of the restricted range of the memory effect can be reduced by manipulating the sample’s speckle pattern.
Scattering media are an ongoing challenge for all kind of imaging technologies including coherent and incoherent principles. Inspired by new approaches of computational imaging and supported by the availability of powerful computers, spatial light modulators, light sources and detectors, a variety of new methods ranging from holography to time-of-flight imaging, phase conjugation, phase recovery using iterative algorithms and correlation techniques have been introduced and applied to different types of objects. However, considering the obvious progress in this field, several problems are still matter of investigation and their solution could open new doors for the inspection and application of scattering media as well. In particular, these open questions include the possibility of extending the 2d-approach to the inspection of depth-extended objects, the direct use of a scattering media as a simple tool for imaging of complex objects and the improvement of coherent inspection techniques for the dimensional characterization of incoherently radiating spots embedded in scattering media. In this paper we show our recent findings in coping with these challenges. First we describe how to explore depth-extended objects by means of a scattering media. Afterwards, we extend this approach by implementing a new type of microscope making use of a simple scatter plate as a kind of flat and unconventional imaging lens. Finally, we introduce our shearing interferometer in combination with structured illumination for retrieving the axial position of fluorescent light emitting spots embedded in scattering media.
We present an improved iteration algorithm for speckle-correlation imaging through scattering media. We employ an approximate solution obtained from a bispectrum-analysis method as the initial condition of the iterative process. This method avoids several different runs performed with different random initial conditions in the traditional iteration algorithm and reduces the execution time in comparison with the conventional bispectrum-analysis method. Therefore, we obtain a balance between image quality and reconstruction speed. The feasibility of the proposed method is proved by the experimental results.
KEYWORDS: Digital holography, Digital image correlation, Sensors, Spiral phase plates, Wavefronts, Holograms, 3D metrology, Optical engineering, 3D image processing, Digital imaging
Different methods for the measurement of in-plane and out-of-plane nanodisplacements of microscopic samples are discussed and compared. It is shown that correlation methods are suited for in-plane displacement measurements and can achieve accuracies of a few nanometers. The method based on vortices tracking can be used for in-plane displacement measurements, but its accuracy is lower compared with the intensity correlation method. The holographic methods allow the measurement of in-plane and out-of-plane displacements at the same time; but in this case, a quite complex setup is required. A combination of correlation methods for in-plane measurement and digital holography for out-of-plane plane measurements is also discussed. The accuracy of the different methods was determined by comparison with a calibrated reference.
Phase retrieval methods have useful applications for optical imaging, metrology and 3D reconstruction. One such technique to recover the phase of the object wavefront is digital holography. In this paper we will show applications of digital holographic techniques for the time resolved measurement of deformation of microelectromechanical systems (MEMS) and for determination of residual stresses. Furthermore digital holography can be used for the investigations of microscopic samples and its resolution can be increased by using short wavelength and oblique illumination. We will see as well that dark-field digital holographic microscopy can be used to visualize biological specimens. A phase retrieval methods, which does not use a reference wave is also described in the last part of the paper.
Advances in computer technology are moving real-time capable, digital holography into the realm of near future
feasibility. The small pixel size required in the recording of even small objects and the large detector area
(high numerical aperture in a lenseless recording setup) required for high resolution reconstruction results in
large amounts of data, especially considering real-time video applications. The special requirements posed by
digital holographic microscopy using lasers operating in the UV range are another application generating large
quantities of data that suggest the use of compression for transmission and storage.
Holograms differ significantly from natural images, as both the intensity and the phase of the incoming
wavefront are recorded. The information about the recorded object is non-localized in the detector plane and in
many applications the phase is far more important than the intensity as it provides information about different
optical path length (e.g. distance and thus shape in metrology, presence of transparent structures in microscopy).
This paper examines the statistical properties of PSI holograms. The holograms are transformed using Fres-
nelets, a wavelet analysis of the reconstructed wavefront in the object plane. Since the wavefront is complex
valued, the complex amplitude has been separated into real-valued phase and amplitude before wavelet trans-
formation. The results show that while the phase can be statistically modeled using a Generalized Gaussian
Distribution (GGD) with exponent α ≈ 1.5, the statistics of the amplitude seem to be the result of two separable
components, each corresponding to GGD. These are identified as the speckle field caused by sub-wavelength
surface roughness with α ≈ 2 and the actual object with α ≈ 1. These result suggest the separate application of
classical image compression based on GGD statistics in the subbands to the phase, the speckle amplitude and
the object amplitude.
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