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André Lochthofen
Researcher at Univ Duisburg-Essen
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Publications (2)
Proceedings Article | 16 February 2009 Paper
Investigation of the electrical activity of V-defects in GaN using scanning force microscopy
André Lochthofen, Wolfgang Mertin, Gerd Bacher, Lutz Hoeppel, Stefan Bader, Jürgen Off, Berthold Hahn
Proceedings Volume 7216, 721610 (2009) https://doi.org/10.1117/12.808992
KEYWORDS: Gallium nitride, Atomic force microscopy, Doping, Temperature metrology, Heterojunctions, Scanning transmission electron microscopy, Interfaces, Microscopy, Oxides, Image transmission
Proceedings Article | 8 February 2007 Paper
Degradation studies of InGaN/GaN heterostructure laser diodes using a Kelvin Force Microscope
Proceedings Volume 6473, 64730Z (2007) https://doi.org/10.1117/12.704855
KEYWORDS: Diodes, Semiconductor lasers, Microscopy, Heterojunctions, Gallium nitride, Mirrors, Electroluminescence, Gold, Silicon carbide, Magnesium
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