Dr. Athanasios J. Syllaios Profile

Dr. Athanasios J. Syllaios

Research Professor

SPIE Involvement:

Conference Program Committee | Author | Instructor

Proceedings Article | 3 October 2024 Presentation + Paper

Analyzing thermal conductance measurements in microbolometers

A.J. Syllaios, Gavin Farmer, Alia Naciri, Usha Philipose, Chris Littler

Proceedings Volume 13145, 1314503 (2024) https://doi.org/10.1117/12.3028134

KEYWORDS: Microbolometers, Resistance, Temperature metrology, Electrical conductivity, Infrared imaging, Heatsinks, Staring arrays, Readout integrated circuits, Amorphous silicon

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Proceedings Article | 3 October 2024 Presentation + Paper

Effects of thermal annealing on vanadium oxide thin film properties

Alia Naciri, Gavin Farmer, Chris Littler, A.J. Syllaios, Usha Philipose

Proceedings Volume 13145, 1314504 (2024) https://doi.org/10.1117/12.3028275

KEYWORDS: Annealing, Vanadium, Oxygen, Oxides, Electrical properties, Argon, Vacuum, Thin films, Resistance, Microbolometers

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Proceedings Article | 30 September 2022 Presentation + Paper

Design and development of innovative vanadium oxide, CNT, and graphene based high-performance microbolometer

Ashok Sood, John Zeller, Usha Philipose, A. Syllaios, Latika Chaudhary, Harry Efstathiadis

Proceedings Volume 12234, 122340E (2022) https://doi.org/10.1117/12.2644037

KEYWORDS: Graphene, Microbolometers, Vanadium, Scanning electron microscopy, Silicon, Sputter deposition, Oxides, Long wavelength infrared, Temperature metrology

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Proceedings Article | 30 September 2022 Presentation + Paper

Conductivity and low frequency noise in VOx thin films

M. Harcrow, C. Littler, U. Philipose, B. Western, V. Lopes, A. Syllaios

Proceedings Volume 12234, 1223405 (2022) https://doi.org/10.1117/12.2632758

KEYWORDS: Thin films, Resistance, Data modeling, Temperature metrology, Microbolometers, Vanadium, Solids, Oxygen, Thin film devices, Thermal modeling

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Proceedings Article | 14 May 2018 Paper

Material considerations for current and next generation microbolometer technology

A. Syllaios, M. Harcrow, B. Western, V. Lopes, C. Littler, Ray Gunawidjaja, Zhi-Gang Yu

Proceedings Volume 10656, 106560E (2018) https://doi.org/10.1117/12.2303728

KEYWORDS: Particles, Amorphous silicon, Temperature metrology, Metals, Microbolometers, Resistance, Nanoparticles, Data modeling, Vanadium, Dielectrics

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Proceedings Article | 31 May 2012 Paper

Uncooled silicon germanium oxide (Si[sub]x[/sub]Ge[sub]y[/sub]O[sub]1-x-y[/sub]) thin films for infrared detection

M. Hai, M. Hesan, J. Lin, Q. Cheng, M. Jalal, A. Syllaios, S. Ajmera, M. Almasri

Proceedings Volume 8353, 835317 (2012) https://doi.org/10.1117/12.919708

KEYWORDS: Silicon, Oxygen, Germanium, Silicon films, Thin films, Temperature metrology, Microbolometers, Resistance, Oxides, X-ray diffraction

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Proceedings Article | 21 May 2011 Paper

Performance improvement in amorphous silicon based uncooled microbolometers through pixel design and materials development

Sameer Ajmera, John Brady, Charles Hanson, Tom Schimert, A. Syllaios, Michael Taylor

Proceedings Volume 8012, 80121L (2011) https://doi.org/10.1117/12.884249

KEYWORDS: Amorphous silicon, Hydrogen, Staring arrays, Microbolometers, Sensors, Readout integrated circuits, Capacitors, Resistance, Bolometers, Packaging

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Proceedings Article | 28 July 2010 Paper

Small pixel a-Si/a-SiGe bolometer focal plane array technology at L-3 Communications

Charles Hanson, Sameer Ajmera, John Brady, Thomas Fagan, William McCardel, Diane Morgan, Tom Schimert, A. J. Syllaios, Michael Taylor

Proceedings Volume 7660, 76600R (2010) https://doi.org/10.1117/12.852511

KEYWORDS: Staring arrays, Amorphous silicon, Capacitors, Digital filtering, Packaging, Sensors, Semiconducting wafers, Readout integrated circuits, Electronic filtering, Infrared radiation

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Proceedings Article | 4 May 2010 Paper

Amorphous silicon thin-films for uncooled infrared microbolometer sensors

Sameer Ajmera, A. Syllaios, Greg Tyber, Michael Taylor, Russell Hollingsworth

Proceedings Volume 7660, 766012 (2010) https://doi.org/10.1117/12.850545

KEYWORDS: Amorphous silicon, Microbolometers, Hydrogen, Thin films, Temperature metrology, Plasma, Infrared sensors, Sensors, Resistance, Infrared radiation

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Proceedings Article | 7 May 2009 Paper

Advances in small-pixel, large-format α-Si bolometer arrays

T. Schimert, C. Hanson, J. Brady, T. Fagan, M. Taylor, W. McCardel, R. Gooch, M. Gohlke, A. Syllaios

Proceedings Volume 7298, 72980T (2009) https://doi.org/10.1117/12.818576

KEYWORDS: Staring arrays, Sensors, Capacitors, Digital filtering, Bolometers, Electronic filtering, Thermography, Infrared radiation, Mid-IR, Resistance

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Proceedings Article | 17 April 2008 Paper

Amorphous silicon-based large-format uncooled FPA microbolometer technology

T. Schimert, J. Brady, T. Fagan, M. Taylor, W. McCardel, R. Gooch, S. Ajmera, C. Hanson, A. Syllaios

Proceedings Volume 6940, 694023 (2008) https://doi.org/10.1117/12.784661

KEYWORDS: Staring arrays, Packaging, Amorphous silicon, Capacitors, Microbolometers, Semiconducting wafers, Infrared radiation, Digital filtering, Thermography, Standard readout integrated circuits

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Proceedings Article | 31 May 2005 Paper

Measurement of thermal time constant of microbolometer arrays

A. Syllaios, Miranda Ha, William McCardel, Thomas Schimert

Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.603153

KEYWORDS: Microbolometers, Time metrology, Thermography, Infrared radiation, Amorphous silicon, Temperature metrology, Resistance, Photodetectors, Sensors, Mercury cadmium telluride

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Proceedings Article | 21 February 2001 Paper

Low-cost low-power uncooled 120x160 a-Si-based microinfrared camera for law enforcement applications

Thomas Schimert, N. Cunningham, Glenn Francisco, Roland Gooch, J. Gooden, P. McCardel, Bryan Neal, Bobbi Ritchey, J. Rife, A. Syllaios, John Tregilgas, John Brady, J. Gilstrap, Steven Ropson

Proceedings Volume 4232, (2001) https://doi.org/10.1117/12.417531

KEYWORDS: Amorphous silicon, Cameras, Infrared cameras, Digital signal processing, Packaging, Microbolometers, Staring arrays, Sensors, Signal processing, Temperature metrology

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Proceedings Article | 21 July 2000 Paper

Low-power uncooled 120x160 a-Si-based micro infrared camera for unattended ground sensor applications

Thomas Schimert, John Brady, Steven Ropson, Roland Gooch, Bobbi Ritchey, P. McCardel, A. Syllaios, John Tregilgas, K. Rachels, M. Weinstein, John Wynn

Proceedings Volume 4040, (2000) https://doi.org/10.1117/12.392561

KEYWORDS: Amorphous silicon, Digital signal processing, Infrared cameras, Unattended ground sensors, Cameras, Sensors, Microbolometers, Signal processing, Packaging, Staring arrays

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Proceedings Article | 7 October 1994 Paper

Optical absorption coefficient of CdZnTe

A. Syllaios, Pok-Kai Liao, Brian Dean

Proceedings Volume 2274, (1994) https://doi.org/10.1117/12.189248

KEYWORDS: Absorption, Mid-IR, Cadmium, FT-IR spectroscopy, Tellurium, Temperature metrology, Annealing, Spectroscopy, Mercury cadmium telluride, Zinc

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Proceedings Article | 13 July 1994 Paper

Wideband magneto-optical characterization of HgCdTe

Joseph McDonald, George Tanton, John Grisham, Charles Christensen, A. Syllaios

Proceedings Volume 2228, (1994) https://doi.org/10.1117/12.179674

KEYWORDS: Mercury cadmium telluride, Interferometers, Plasma

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Proceedings Article | 13 July 1994 Paper

Magneto-optical characterization of HgCdTe thin films

A. Syllaios, Jeff Anderson, Luigi Colombo, Chris Littler, G. Brostow, Charles Christensen, John Grisham, Frederick Clarke

Proceedings Volume 2228, (1994) https://doi.org/10.1117/12.179673

KEYWORDS: Mercury cadmium telluride, Thin films, Infrared radiation, Absorption, Statistical analysis, Nondestructive evaluation, Diagnostics, Spectroscopy

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Showing 5 of 17 publications

Conference Committee Involvement (3)

Infrared Sensors, Devices, and Applications XV

3 August 2025 | San Diego, California, United States

Infrared Sensors, Devices, and Applications XIV

20 August 2024 | San Diego, California, United States

Infrared Sensors, Devices, and Applications XIII

22 August 2023 | San Diego, California, United States

Course Instructor

SC1326: Microbolometers for Infrared Imaging

Microbolometers are used in Infrared imaging systems in the MWIR to Terahertz spectral range. The goal of this course is to describe in detail the microbolometer device structure, theory of operation, and the associated figures of merit such as the Noise Equivalent Temperature difference (NETD), and thermal time constant. A relevant material parameter is the Temperature Coefficient of Resistance (TCR) that affects the device NETD and dynamic range. Another material/device parameter affecting NETD is the electrical noise comprised of frequency dependent and frequency independent (White noise) components. Thermal Resistance (Rth) also affects the microbolometer NETD and thermal time constant. Rth is a measure of the device thermal isolation by mechanical suspension and by encapsulation in high vacuum. Wafer level or single device vacuum packaging is a major backend process in microbolometer array manufacturing.

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