Bin Li
at Sun Yat-Sen Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 March 2008 Paper
Bin Li, Jiwu Huang, Yun Q. Shi
Proceedings Volume 6819, 681912 (2008) https://doi.org/10.1117/12.765817
KEYWORDS: Steganography, Steganalysis, Databases, Image classification, Feature extraction, JPEG2000, Stochastic processes, Ferroelectric LCDs, Wavelets, Convolution

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