BlackScreen rear-projection display screens, developed by Jenmar Visual Systems, are well suited for cockpit avionics applications primarily because they exhibit both high image resolution and high ambient light rejection. These characteristics combine to produce highly visible high-contrast images, even in very brightly lit viewing environments. On-screen optical noise commonly referred to as speckle and grain, can be a problem in these screens. This paper will describe the methods we have developed to measure speckle and grain. We will also show data from prototype screens that we have modified to reduce the magnitude of these artifacts.
One of the most important performance characteristics of a projection system is viewing angle. Screen characteristics alone such as reflectance, transmission, gain and half-gain angle do not predict real system performance. System viewing angle depends on the screen, but also on other factors, including the projector and the viewing environment. This paper describes a model that combines these effects. We use this model to calculate the viewing angles of projection systems.
The characteristics of BlackScreenTM for RP-TV will be described and compared with typical lenticular black-stripe screens. Careful management of light by the BlackScreen structure combines to produce an image that is optimized for human vision. It is high contrast, high-resolution, and visible over a wide viewing angle. Tuning this technology for RP-TV involves refining the screen structure to balance the performance characteristics of contrast and viewing angle. The BlackScreen product offering includes symmetric and asymmetric screens.
BlackScreen rear-projection display screens, developed by Jenmar Visual Systems of Fremont California are well suited for cockpit avionics applications primarily because they exhibit both high image resolution and high ambient light rejection. These characteristics combine to produce a high- contrast image on these screens, even in very brightly lit viewing environments. On-screen optical noise commonly referred to as graininess or speckle, can often be a problem in rear-projection systems. These image artifacts appear as grainy patches in the image that move with the field-of-view of the observer and are most visible in the near field (i.e., approximately 12 to 24 inches from the screen). This paper will describe the methods we are using to characterize these artifacts in BlackScreen. Our testing uses a range of projection systems and characterization methods. We will also describe our approach to reduce these artifacts, and will illustrate that approach with engineering data.
The power spectral density function (PSD) is being employed to specify the surface finish and transmitted wavefront in the mid-spatial frequency regime for laser beam optics of the National Ignition Facility (NIF). The instrument used to measure the PSD is a phase measuring Fizeau interferometer. The phase map produced by the interferometer is digitally processed to create the PSD. Before one can use the PSD information, it is necessary to evaluate the fidelity of the interferometer spatial frequency response. Specifically, one must measure the overall transfer function of the instrument. To accomplish this, we perform a two-step 'calibration' process. We first measure a known precision phase object with the interferometer and then compare the measured PSD to an ideal numerical simulation which represents the theoretical PSD. The square root of the ratio of the measured function to the simulation is defined as the transfer function of the instrument. We present experimental results for both reflective and transmissive test objects, including effects such as the test object orientation and longitudinal location in the interferometer cavity. We also evaluate the accuracy levels obtained using different test objects.
KEYWORDS: Wavefronts, Spatial frequencies, National Ignition Facility, Laser systems engineering, Optical components, Optical transfer functions, Modulation, High power lasers, Surface roughness, Interferometers
This paper describes the use of Fourier techniques to characterize the transmitted and reflected wavefront of optical components. Specifically, a power spectral density (PSD), approach is used. High power solid-state lasers exhibit non-linear amplification of specific spatial frequencies. Thus, specifications that limit the amplitude of these spatial frequencies are necessary in the design of these systems. Further, NIF optical components have square, rectangular or irregularly shaped apertures with major dimensions up to 800 nm. Components with non-circular apertures can not be analyzed correctly with Zernicke polynomials since these functions are an orthogonal set for circular apertures only. A more complete and powerful representation of the optical wavefront can be obtained by Fourier analysis in 1 or 2 dimensions. The PSD is obtained from the amplitude of frequency components present in the Fourier spectrum. The shape of a resultant wavefront or the focal spot of a complex multi-component laser system can be calculated and optimize using PSDs of the individual optical components which comprise the system. Surface roughness can be calculated over a range of spatial scale-lengths by integrating the PSD. FInally, since the optical transfer function of the instruments used to measure the wavefront degrades at high spatial frequencies, the PSD of an optical component is underestimated. We can correct for this error by modifying the PSD function to restore high spatial frequency information. The strengths of PSD analysis are leading us to develop optical specifications incorporating this function for the planned National Ignition Facility.
This paper discusses the techniques, developed over the past year, for high spatial resolution measurement and analysis of the transmitted and/or reflected wavefront of large aperture ICF optical components. Parts up to 400 mm by 750 mm have been measured and include: laser slabs, windows, KDP crystals and lenses. The measurements were performed using state-of- the-art commercial phase shifting interferometers at a wavelength of 633 micrometer. Both 1 and 2-D Fourier analysis have been used to characterize the wavefront; specifically the power spectral density (PSD) function was calculated. The PSDs of several precision optical components are shown. The PSD(nu) is proportional to the (amplitude)2 of components of the Fourier frequency spectrum. The PSD describes the scattered intensity and direction as a function of scattering angle in the wavefront. The capability of commercial software is limited to 1-D Fourier analysis only. We are developing our own 2-D analysis capability in support of work to revise specifications for NIF optics. Two-dimensional analysis uses the entire wavefront phase map to construct 2-D PSD functions. We have been able to increase the signal-to-noise relative to 1-D and can observe very subtle wavefront structure. The physics of the NIF laser design dictate partitioning the wavefront into three regimes of spatial wavelength (or spatial frequency). We discuss the data in terms of the following three scale length regimes: (1) short scale, or 'micro roughness,' having scale lengths less than 120 micrometer; (2) mid-spatial scale, with scale lengths from 0.12 to 33 mm; and (3) long scale, or conventional 'optical figure/curvature,' having scale lengths greater than 33 mm. Regular repetitive wavefront structure has been observed in all three regimes, ranging from 10 micrometer to 100 mm in scale length. The magnitude of these structures are typically from lambda/100 to lambda/20. Structure has been detected in optical materials and on the surfaces of finished parts. We believe the sources of these structures are small fabrication errors. The Modeling Group at LLNL is using this data in beam propagation codes to assist in optimizing laser system design and to develop optics specifications for the NIF.
This paper describes the use of Fourier techniques to characterize the wavefront of optical components, specifically, the use of the power spectral density (PSD) function. The PSDs of several precision optical components will be shown. Many of the optical components of interest to us have square, rectangular or irregularly shaped apertures with major dimensions up to 800 mm. The wavefronts of components with noncircular apertures cannot be analyzed with Zernicke polynomials since these functions are an orthogonal set for circular apertures only. Furthermore, Zernicke analysis is limited to treating low frequency wavefront aberrations; mid-spatial scale and high frequency error are expressed only as 'residuals'. A more complete and powerful representation of the optical wavefront can be obtained by Fourier analysis in 1 or 2 dimensions. The PSD is obtained from the amplitude of frequency components present in the Fourier spectrum. The PSD corresponds to the scattered intensity as a function of scattering angle in the wavefront and can be used to describe the intensity distribution at focus. The shape of a resultant wavefront or the focal spot of a complex multi- component laser system can be calculated and optimized using the PSDs of individual optical components which comprise it.
This paper discusses the results of high spatial resolution measurement of the transmitted or reflected wavefront of optical components using phase shifting interferometry with a wavelength of 6328 angstrom. The optical components studied range in size from approximately 50 mm X 100 mm to 400 mm X 750 mm. Wavefront data, in the form of 3D phase maps, have been obtained for three regimes of scale length: 'micro roughness', 'mid-spatial scale', and 'optical figure/curvature'. Repetitive wavefront structure has been observed with scale lengths from 10 mm to 100 mm. The amplitude of this structure is typically 1/100 to 1/20. Previously unobserved structure has been detected in optical materials and on the surfaces of components. We are using this data to assist in optimizing laser system design, to qualify optical components and fabrication processes under study in our component development program.
In the second half of the 1990's, LLNL and others will be designing and beginning construction of the National Ignition Facility. This new laser will be capable of producing the worlds first controlled fusion ignition and burn, completing a vital milestone on the path of Fusion Energy. This facility will use more than 7,000 optical components, most of which have a rectangular aperture, which measure greater than 600 mm on the diagonal. In order to optimize the performance versus cost of the laser system, we have determined that specifications based on the Power Spectral Density (PSD) functions are the most effective for controlling mid-spatial wavelength errors. The draft optics specifications based on a combination of PSD and conventional roughness and P-V requirements are presented, with a discussion of their origins. The emphasis is on the application of a PSD function for transmitted wavefront optical specifications, and the benefits thereof. The PSD function is the most appropriate way to characterize transmitted wavefront errors with spatial frequencies ranging from several centimeters to a few hundred nanometers, with amplitudes in the (lambda) /100 regime. Such errors are commonly generated by cost effective, deterministic finishing technologies, and can be damaging to the laser, as well as causing unnecessary energy loss and inability to focus, in a high energy laser application. In addition, periodic errors can occur as a result of errors at other steps in the fabrication process, such as machine vibration in a fixed abrasive step, or material homogeneity ripple. The control of such errors will be essential to the construction of future high energy lasers.
This paper describes a database of wavefront measurements of large aperture optical components. This database is being compiled as part of our component development program in preparation for the National Ignition Facility (NIF). The data is stored electronically in the form of 3D phase maps of the reflected or transmitted wavefront, measured by phase shifting interferometry at 6328 angstrom. The database will serve both technical and administrative purposes for the NIF project. These purposes will be described, as well as the type of data and measurement techniques used.
Research on Inertial Confinement Fusion (ICF) has progressed rapidly in the past several years. As a consequence LLNL is developing plans to upgrade the current 120 kJ solid state (Nd3-phosphate glass) Nova laser to a 1 . 5 to 2 megajoule system with the goal of achieving fusion ignition. The design of the planned Nova Upgrade is briefly discussed. Because of recent improvements in the damage resistance of optical materials it is now technically and economically feasible to build a megajoule-class solid state laser. Specifically the damage threshold of Nd3- doped phosphate laser glass muliilayer dielectric coatings and non-linear optical crystals (e. g. KDP) have been dramatically improved. These materials now meet the fluence requirements for a 1. 5-2 MJ Nd3-glass laser operating at 1054 and 351 nm and at a pulse length of 3 ns. The recent improvements in damage thresholds are reviewed threshold data at both 1064 and 355 nm and the measured pulse length scaling are presented. 1.
Laser induced damage to optical components severely limits the operating
fluence of high peak power lasers used for fusion research such as the Nova laser
at the Lawrence Livermore National Laboratory. In particular, surfaces and
optical thin films often damage at a lower fluence than bulk materials in large
aperture, high quality optics. We have designed and are fabricating new 94 cm
turning mirrors for Nova as part of the "Precision Nova" program to improve
beam quality. A new design has been optimized for updated optical performance
specifications including increased damage resistance. The new mirror design
will operate at all turning angles required by the ten Nova beamlines. This
flexibility reduces mirror inventory and fabrication cost. A process of
"conditioning" the mirror coating has been developed that is permanent and
increases the damage threshold by as much as a factor of 2-3x.
Results are presented that show the damage thresholds of e-beam deposited multi- layer HfO2/SiO2 thin films can be permanently increased by a factor of 2 to 3 by illumination with subthreshold fluences of laser light. This sub-threshold illumination procedure is referred to as "laser conditioning". The films used in this study were prepared by three different physical-vapor-deposition techniques: ion-beam sputtering, plasma plating and e- beam evaporation. Only the e-beam deposited films showed consistent and significant improvement with laser conditioning. Of the material pairs examined (Hf02/Si02, ZrO2/SiO2 and TiO2/SiO2), Hf02/Si02 gave the greatest and most consistent damage improvement with conditioning. The number of layers and the reflective or transmissive characteristics of the HfO2/SiO2 films were found to have little` impact on laser conditioning of the film. The results show that the damage thresholds of a wide range of e-beam deposited coatings (e.g. HR's, polarizers, etc.) can be improved by laser conditioning. Several possible conditioning mechanisms are examined.
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