Prof. Chao-Ching Ho Profile

Prof. Chao-Ching Ho

Professor at National Taipei Univ of Technology

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Author

Publications (7)

Proceedings Article | 10 April 2024 Poster + Paper

Prediction of critical dimensions for 3D TSV structures using artificial neural network

Jia-Wei Li, Eugene Su, Chao-Ching Ho

Proceedings Volume 12955, 129552J (2024) https://doi.org/10.1117/12.3010132

KEYWORDS: Finite-difference time-domain method, Reflectivity, Artificial neural networks, Simulations, Reflection, Critical dimension metrology, Modeling, Electromagnetic simulation, Education and training, Spectral data processing

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SPIE Journal Paper | 19 January 2024

Enhancing titanium spacer defect detection through reinforcement learning-optimized digital twin and synthetic data generation

Sankarsan Mohanty, Eugene Su, Chao-Ching Ho

JEI, Vol. 33, Issue 01, 013021, (January 2024) https://doi.org/10.1117/12.10.1117/1.JEI.33.1.013021

KEYWORDS: Education and training, Data modeling, Defect detection, Inspection, Titanium, Holmium, Light sources and illumination, Performance modeling, Cameras, Windows

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Proceedings Article | 11 August 2023 Presentation + Paper

Reinforcement learning optimized digital twin based synthetic data generation for defect detection of titanium spacer

Sankarsan Mohanty, Eugene Su, Chao-Ching Ho

Proceedings Volume 12623, 1262308 (2023) https://doi.org/10.1117/12.2673529

KEYWORDS: Data modeling, Inspection, Windows, Image processing, Data acquisition

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Proceedings Article | 27 April 2023 Poster + Paper

On-line real-time detection system for wafer surface defects based on deep learning and generative adversarial network

Chao-Ching Ho, Shou-Lin Chu

Proceedings Volume 12496, 124962S (2023) https://doi.org/10.1117/12.2657960

KEYWORDS: Data modeling, Semiconducting wafers, Education and training, Image segmentation, Network architectures, Defect detection, Image processing, Embedded systems, Mathematical optimization, Deep learning

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Proceedings Article | 20 May 2022 Poster + Presentation + Paper

Deep convolutional neural network-based surface defect detection for wafer grinding jig

Chao-Ching Ho, Xuan Yan, Sankarsan Mohanty, Yu-wei Lin

Proceedings Volume 12137, 121370P (2022) https://doi.org/10.1117/12.2620287

KEYWORDS: Image processing, Defect detection, Semiconducting wafers, Neural networks, Abrasives

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Proceedings Article | 7 March 2019 Paper

Development of auto defect inspection system for cell phone silicone rubber gasket

Chao-Ching Ho, Jhih-Jia Lu

Proceedings Volume 11053, 1105303 (2019) https://doi.org/10.1117/12.2508132

KEYWORDS: Silicon, Inspection, Cell phones, Cameras, Defect inspection, Light sources and illumination, Iron, Manufacturing, Optical inspection, Image processing

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Proceedings Article | 31 January 2013 Paper

In situ chatter suppression in milling machines using microphone

Chao-Ching Ho, Jin-Chen Hsu, Chih-Hao Lien, Ping-Yen Hsieh

Proceedings Volume 8759, 87592G (2013) https://doi.org/10.1117/12.2014420

KEYWORDS: Spindles, Acoustics, Signal processing, Finite element methods, Signal detection, Surface roughness, Feedback control, Surface finishing, Signal analysis, Sensors

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Showing 5 of 7 publications

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