Dr. Chong Yue
at Chongqing Academy of Metrology and Quality Inspect
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 13 December 2024 Paper
Proceedings Volume 13500, 135000B (2024) https://doi.org/10.1117/12.3048148
KEYWORDS: Particles, Scanning electron microscopy, Calibration, Edge detection, Microspheres, Image analysis, Electron microscopes, Time metrology, Statistical analysis, Reflection

Proceedings Article | 12 December 2024 Paper
Chong Yue, Yueqing Ding, Zhen Wu, Lei Tao, Yingqian Ni, Kun Jiang
Proceedings Volume 13446, 134461D (2024) https://doi.org/10.1117/12.3054245
KEYWORDS: Atomic force microscopy, Metrology, Interferometers, Atomic force microscope, Algorithm development, Raster graphics, Reliability, MATLAB, Inspection, Semiconductors

Proceedings Article | 18 November 2024 Paper
Proceedings Volume 13398, 1339814 (2024) https://doi.org/10.1117/12.3049736
KEYWORDS: Film thickness, Thin films, Scanning electron microscopy, Ellipsometry, Electron microscopes, Nanofilms, Reflection, Systems modeling, Dispersion, Mathematical modeling

Proceedings Article | 11 April 2019 Paper
Proceedings Volume 11028, 110281A (2019) https://doi.org/10.1117/12.2519919
KEYWORDS: Reflection, Interfaces, Gold, Surface plasmons, Photons, Metals, Glasses, Reflectivity, Spin polarization

Proceedings Article | 12 January 2018 Paper
Proceedings Volume 10622, 1062208 (2018) https://doi.org/10.1117/12.2286291
KEYWORDS: Polarization, Photon polarization, Gaussian beams, Photons, Metrology, Beam splitters, Modulation, Glasses, Solids, Chaos

Showing 5 of 6 publications
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