Dr. Christopher L. Muhlstein Profile

Dr. Christopher L. Muhlstein

at The Pennsylvania State Univ

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 6 January 2006 Paper

Fatigue of polycrystalline silicon films with thin surface oxides

O. Pierron, C. Muhlstein

Proceedings Volume 6111, 611106 (2006) https://doi.org/10.1117/12.646468

KEYWORDS: Silicon films, Oxides, Silicon, Microelectromechanical systems, Resonators, Scanning electron microscopy, Photomicroscopy, Humidity, Silica, Oxidation

Read Abstract +

Proceedings Article | 22 January 2005 Paper

Long-term reliability of single-crystal silicon thin films: the influence of environment on the fatigue damage accumulation rate

Olivier Pierron, Christopher Muhlstein

Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.591219

KEYWORDS: Silicon films, Humidity, Silicon, Reliability, Microelectromechanical systems, Oxides, Protactinium, Beam shaping, Photomicroscopy, Oxidation

Read Abstract +

Proceedings Article | 23 December 2003 Paper

Reaction-layer fatigue: understanding the limitations of structural silicon

Christopher Muhlstein, O. Pierron

Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.527465

KEYWORDS: Silicon, Silicon films, Oxides, Interfaces, Thin films, Crystals, Failure analysis, Microelectromechanical systems, Mechanics, Oxidation

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years