David Baudin
at CEA-IRFU
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 1 October 2024 Presentation + Paper
Marco Feroci, Giovanni Ambrosi, Matias Antonelli, Andrea Argan, Viktor Babinec, Marco Barbera, Paolo Bastia, Joerg Bayer , Pierluigi Bellutti, Bruna Bertucci, Giuseppe Bertuccio, Federica Bonfitto, Valter Bonvicini, Enrico Bozzo, David Baudin, Florent Bouyjou, Daniele Brienza, Franck Cadoux, Riccardo Campana, Roberto Candia, Jiewei Cao, Elisabetta Cavazzuti, Francesco Ceraudo, Tianxiang Chen, Wen Chen, Artur Coimbra, Angelo Colucci, Xiaoqing Cong, Daniela Cirrincione, Nicolas De Angelis, Alessandra De Rosa, Giovanni Della Casa, Ettore Del Monte, Gaspare Di Cicca, Sergio Di Cosimo, Giuseppe Dilillo, Roman Dohnal, Immacolata Donnarumma, Yuri Evangelista, Peng Fan, Qingmei Fan, Yannick Favre, Emanuele Fiandrini, Francesco Ficorella, Na Gao, Olivier Gevin, Marco Grassi, Manuel Guedel, Alejandro Guzman Cabrera, Dong Han, Huilin He, Paul Hedderman, Jan-Willem den Herder, Richard Hynek, Merlin Reynaard Kole, Vladimir Karas, Martin Komarek, Claudio Labanti, Daniel La Marra, Giuseppe Lesci, Gang Li, Loghui Li, Tiangtong Li, Olivier Limousin, Hongwei Liu, Rui Liu, Yichen Liu, Xiaojing Liu, Ugo Lo Cicero, Jens Loehring, Giovanni Lombardi, Fang-Jun Lu, Tao Luo, Piero Malcovati, Andrea Marinucci, Filippo Mele, Vasco Mendes, Martin Merkl, Aline Meuris, Malgorzata Michalska, Alfredo Morbidini, Gianluca Morgante, Fabio Muleri, Riccardo Munini, Lorenzo Mussolin, Barbara Negri, Petr Novák, Witold Nowosielski, Alessio Nuti, Piotr Orleanski, Roland Ottensamer, Luigi Pacciani, Stephane Paltani, Teng Pan, Giancarlo Pepponi, Emanuele Perinati, Raffaele Piazzolla, Antonino Picciotto, Samuel Pliego, Andreas Putz, Alexandre Rachevski, Irina Rashevskaia, Alina Samusenko, Andrea Santangelo, Stephane Schanne, Roberto Serafinelli, Konrad Skup, Libor Sveda, Jiri Svoboda, Chris Tenzer, Michela Todaro, Gabriel Torok, Alessio Trois, Andrea Vacchi, Salvatore Varisco, Francesco Villa, Enrico Virgilli, Hongwen Xiang, Hao Xiong, Jian Wang, Xianqi Wang, Berend Winter, Zhenyu Wu, Xin Wu, Yupeng Xu, Gianluigi Zampa, Nicola Zampa, Andrzej Zdziarski, Long Zhang, Shu Zhang, Shuang-Nan Zhang, Yonghe Zhang, Wenda Zhang, Qiao Zhao, Cheng Zhu, Xiaofei Zhu, Nicola Zorzi
Proceedings Volume 13093, 130931X (2024) https://doi.org/10.1117/12.3019868
KEYWORDS: Sensors, Collimators, Equipment, Design, X-rays, Capillaries, Optical filters, Prototyping, Astronomy, Power supplies

Proceedings Article | 11 September 2024 Poster + Paper
G. Minervini, A. Argan, M. Feroci, A. Trois, E. Del Monte, D. Brienza, G. Ambrosi, M. Antonelli, M. Barbera, D. Baudin, J. Bayer, P. Bellutti, B. Bertucci, Xingzi Bi, W. Bonvicini, E. Bozzo, F. Bouyjou, F. Cadoux, R. Campana, Jiewei Cao, E. Cavazzuti, F. Ceraudo, Tianxiang Chen, Wen Chen, D. Cirrincione, A. Collura, F. D'Anca, N. De Angelis, A. De Rosa, S. Di Cosimo, G. Didillo, Y. Evangelista, Y. Favre, E. Fiandrini, F. Ficorella, Na Gao, O. Gevin, M. Guedel, Xingbo Han, Huilin He, P. Hedderman, R. Hynek, M. Kole, V. Karas, M. Komarek, D. La Marra, Hong Liang, O. Limousin, Rui Liu, U. Lo Cicero, J. Loehring, G. Lombardi, Fang-Jun Lu, Tao Luo, M. Merkl, A. Meuris, M. Michalska, G. Morgante, R. Munini, L. Mussolin, P. Novák, W. Nowosielski, A. Nuti, P. Orleanski, R. Ottensamer, L. Pacciani, S. Paltani, G. Pepponi, R. Piazzolla, A. Picciotto, S. Pliego Caballero, A. Putz, A. Rachevski, I. Rashevskaya, A. Samusenko, A. Santangelo, S. Schanne, L. Sciortino, K. Skup, L. Sveda, J. Svoboda, C. Tenzer, M. Todaro, A. Vacchi, Hao Xiong, Jian Wang, Xianqi Wang, B. Winter, Xin Wu, G. Zampa, N. Zampa, A. Zdziarski, Shu-Nan Zhang, Xiaoli Zhang, Zhen Zhang, Zijian Zhao, Yupeng Zhou, N. Zorzi
Proceedings Volume 13099, 130991D (2024) https://doi.org/10.1117/12.3020230
KEYWORDS: Sensors, Manufacturing, Collimators, Industry, Equipment, Calibration, X-rays, Fermium, Frequency modulation, Tunable filters

Proceedings Article | 28 August 2024 Poster
Diana Renaud, Hugo Allaire, Axel Barrey, Marion Baumann, David Baudin, Ion Cojocari, Eric Doumayrou, Diego Götz, Philippe Ferrando, Philippe Laurent, Michel Lortholary, Pascal Mercère, Aline Meuris, Frédéric Pinsard, Thibault Pichon, Clara Plasse, Marin Prieur, Léna Provost, Benjamin Schneider, Timothée Tollet, Thierry Tourrette, François Visticot, Norbert Meidinger
Proceedings Volume PC13103, PC131030U (2024) https://doi.org/10.1117/12.3018856

Proceedings Article | 21 August 2024 Presentation + Paper
Margarita Hernanz, Marco Feroci, Yuri Evangelista, Aline Meuris, Stéphane Schanne, Gianluigi Zampa, Chris Tenzer, Jörg Bayer, Witold Nowosielski, Malgorzata Michalska, Emrah Kalemci, Müberra Sungur, Søren Brandt, Irfan Kuvvetli, Daniel Alvarez Franco, Alex Carmona, José-Luis Gálvez, Alessandro Patruno, Jean In' t Zand, Frans Zwart, Andrea Santangelo, Enrico Bozzo, Shuang-Nan Zhang, Fangjun Lu, Yupeng Xu, Riccardo Campana, Ettore Del Monte, Francesco Ceraudo, Alessio Nuti, Giovanni Della Casa, Andrea Argan, Gabriele Minervini, Matias Antonelli, Valter Bonvicini, Mirko Boezio, Daniela Cirrincione, Riccardo Munini, Alexandre Rachevski, Andrea Vacchi, Nicola Zampa, Irina Rashevskaya, Francesco Ficorella, Antonino Picciotto, Nicola Zorzi, David Baudin, Florent Bouyjou, Olivier Gevin, Olivier Limousin, Paul Hedderman, Samuel Pliego, Hao Xiong, Rob de la Rie, Phillip Laubert, Gabby Aitink-Kroes, Lucien Kuiper, Piotr Orleanski, Konrad Skup, Denis Tcherniak, Onur Turhan, Ayhan Bozkurt, Ahmet Onat
Proceedings Volume 13093, 130931Y (2024) https://doi.org/10.1117/12.3020020
KEYWORDS: Cameras, Sensors, Equipment, X-rays, Design, Polarimetry, Anodes, Spatial resolution, X-ray imaging, Silicon

Proceedings Article | 31 August 2022 Poster + Paper
F. Zwart, R. Tacken, J. J. in't Zand, R. de la Rie, M. Limpens, C. Kochanowski, G. Aitink-Kroes, C. van Baren, J. Bayer, D. Baudin, F. Ceraudo, Y. Evangelista, M. Feroci, M. Frericks, J.-L. Gálvez, O. Gevin, M. Hernanz, A. Hormaetxe, P. Laubert, A. Meuris, J. Nab, J. Neelis, C. Tenzer, C. Vogel, G. Zampa
Proceedings Volume 12181, 1218167 (2022) https://doi.org/10.1117/12.2629406
KEYWORDS: Sensors, Electronics, Cameras, Adhesives, Silicon, Hybrid circuits, Spatial resolution, Manufacturing, Electrons, Temperature metrology

Showing 5 of 8 publications
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