David A. R. Niederer
at ETH Zürich
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2008 Paper
Manuel Aschwanden, David Niederer, Andreas Stemmer
Proceedings Volume 6927, 69271R (2008) https://doi.org/10.1117/12.776100
KEYWORDS: Diffraction gratings, Optical components, Electrodes, Wavefront distortions, Diffraction, Dielectric elastomer actuators, Microscopes, Luminescence, Refractive index, Objectives

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